Nanoscale characterization of beta-phase HxLi1-xNbO3 layers by piezoresponse force microscopy

• We investigate a non-destructive approach for the characterization of proton exchanged layers in LiNbO3 with sub-micrometric resolution by means of piezoresponse force microscopy (PFM). Through systematic analyses, we identify a clear correlation between optical measurements on the extraordinary refractive index and PFM measurements on the piezoelectric d(33) coefficient. Furthermore, we quantify the reduction of the latter induced by proton exchange as 83 +/- 2% and 68 +/- 3% of the LiNbO3 value, for undoped and 5mol. % MgO-doped substrates, respectively.

Ämnesord

NATURVETENSKAP  -- Fysik -- Annan fysik (hsv//swe)

NATURAL SCIENCES  -- Physical Sciences -- Other Physics Topics (hsv//eng)

Nyckelord

Niobium oxide

Optical data processing

Refractive index

Nanoscale characterization

Non destructive

Optical measurement

Piezoresponse force microscopy

Proton exchange

Proton exchanged

Systematic analysis

Publikations- och innehållstyp

ref (ämneskategori)

art (ämneskategori)