Automatic generation of breakpoint hardware for silicon debug

• Scan-based silicon debug is a technique that can be used to help find design errors in prototype silicon more quickly. One part of this technique involves the inclusion of break-point modules during the design stage of the chip. This paper focuses on an innovative approach to automatically generate breakpoint modules by means of a breakpoint description language. This language is illustrated using an example, and experimental results are presented that show the efficiency and effectiveness of this new method for generating breakpoint hardware.

Ämnesord

NATURVETENSKAP  -- Data- och informationsvetenskap -- Annan data- och informationsvetenskap (hsv//swe)

NATURAL SCIENCES  -- Computer and Information Sciences -- Other Computer and Information Science (hsv//eng)

TEKNIK OCH TEKNOLOGIER  -- Elektroteknik och elektronik (hsv//swe)

ENGINEERING AND TECHNOLOGY  -- Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)

Nyckelord

Design

Break-point description language (BDL)

Performance analysis

Scan-based silicon debug

Computer aided design

Computer aided software engineering

Computer hardware

Computer programming languages

Computer simulation

Program debugging

Silicon

Microprocessor chips

Publikations- och innehållstyp

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