WFRF:(Mohammad S)
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- Vermeulen, B. (author)
Automatic generation of breakpoint hardware for silicon debug
- Article/chapterEnglish2004
Publisher, publication year, extent ...
- 2004-06-07
- New York, NY, USA :IEEE Computer Society,2004
- printrdacarrier
Numbers
- LIBRIS-ID:oai:DiVA.org:kth-157186
- https://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-157186URI
- https://doi.org/10.1145/996566.996708DOI
Supplementary language notes
- Language:English
- Summary in:English
Part of subdatabase
- SwePubSwePub
Classification
Notes
- QC 20141209
- Scan-based silicon debug is a technique that can be used to help find design errors in prototype silicon more quickly. One part of this technique involves the inclusion of break-point modules during the design stage of the chip. This paper focuses on an innovative approach to automatically generate breakpoint modules by means of a breakpoint description language. This language is illustrated using an example, and experimental results are presented that show the efficiency and effectiveness of this new method for generating breakpoint hardware.
Subject headings and genre
- NATURVETENSKAP Data- och informationsvetenskap Annan data- och informationsvetenskap hsv//swe
- NATURAL SCIENCES Computer and Information Sciences Other Computer and Information Science hsv//eng
- TEKNIK OCH TEKNOLOGIER Elektroteknik och elektronik hsv//swe
- ENGINEERING AND TECHNOLOGY Electrical Engineering, Electronic Engineering, Information Engineering hsv//eng
- Design
- Break-point description language (BDL)
- Performance analysis
- Scan-based silicon debug
- Computer aided design
- Computer aided software engineering
- Computer hardware
- Computer programming languages
- Computer simulation
- Program debugging
- Silicon
- Microprocessor chips
Added entries (persons, corporate bodies, meetings, titles ...)
- Urfianto, Mohammad Z.KTH(Swepub:kth)u1cuat7i (author)
- Goel, S. K. (author)
- KTH (creator_code:org_t)
Related titles
- In:Proceedings of the 41st Design Automation ConferenceNew York, NY, USA : IEEE Computer Society, s. 514-5171581138288
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