Atomic force microscopy to investigate asphalt binders: a state-of-the-art review

Atomic force microscopy to investigate asphalt binders : a state-of-the-art review

QC 20160818
Atomic force microscopy (AFM) is a non-destructive imaging tool, which is capable of qualitative and quantitative surface analysis with sub-nanometer resolution. Simultaneously with the topology at the micro-scale, AFM is capable of acquiring micro-mechanical information such as relative stiffness/Young's modulus, stickiness/adhesion, hardness, energy loss and sample deformation quantitatively. This paper presents an extensive review on the applications of AFM to investigate different physiochemical properties and performances of asphalt binder. AFM techniques and principles, different sample preparation techniques and its effect on observed micro-structures, chemical origin, surface or bulk phenomenon and temperature sensitivity of these micro-structures are also discussed in this paper. All of the studies conducted on this topic clearly indicated that AFM can successfully be utilised as a tool to better understand how the surface morphology and its physicochemical properties are interlinked and related to the binder performances.

In:International Journal on Road Materials and Pavement Design: Taylor & Francis17:3, s. 693-7181468-06292164-7402

By the author/editor: Das, Prabir Kuma ...; Baaj, Hassan; Tighe, Susan; Kringos, Niki

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