Characterizing 3D floating gate NAND flash

• In this paper, we characterize a state-of-The-Art 3D oating gate NAND ash memory through comprehensive experiments on an FPGA platform. Then, we present distinct observations on performance and reliability, such as operation latencies and various error patterns. We believe that through our work, novel 3D NAND ash-oriented designs can be developed to achieve better performance and reliability.

Ämnesord

NATURVETENSKAP  -- Data- och informationsvetenskap -- Datorteknik (hsv//swe)

NATURAL SCIENCES  -- Computer and Information Sciences -- Computer Engineering (hsv//eng)

Nyckelord

Computer science

Computers

Measurements

Error patterns

Floating gates

Fpga platforms

NAND Flash

Performance and reliabilities

State of the art

NAND circuits

Publikations- och innehållstyp

ref (ämneskategori)

kon (ämneskategori)