The ReactorSTM: Atomically resolved scanning tunneling microscopy under high-pressure, high-temperature catalytic reaction conditions

The ReactorSTM : Atomically resolved scanning tunneling microscopy under high-pressure, high-temperature catalytic reaction conditions

Herbschleb, C. T. (author)

Van Der Tuijn, P. C. (author)

Roobol, S. B. (author)

Navarro, V. (author)

Bakker, J. W. (author)

Liu, Q. (author)

Cañas-Ventura, M. E. (author)

Verdoes, G. (author)

Van Spronsen, M. A. (author)

Bergman, M. (author)

Crama, L. (author)

Taminiau, I. (author)

Ofitserov, A. (author)

Van Baarle, G. J. C. (author)

Frenken, J. W. M. (author)

(creator_code:org_t)

AIP Publishing, 2014
2014
English.
In: Review of Scientific Instruments. - : AIP Publishing. - 0034-6748 .- 1089-7623. ; 85:8

Related links:: https://doi.org/10.1...; show more...; https://doi.org/10.1...; https://urn.kb.se/re...; https://doi.org/10.1...; show less...

Abstract Subject headings

To enable atomic-scale observations of model catalysts under conditions approaching those used by the chemical industry, we have developed a second generation, high-pressure, high-temperature scanning tunneling microscope (STM): the ReactorSTM. It consists of a compact STM scanner, of which the tip extends into a 0.5 ml reactor flow-cell, that is housed in a ultra-high vacuum (UHV) system. The STM can be operated from UHV to 6 bars and from room temperature up to 600 K. A gas mixing and analysis system optimized for fast response times allows us to directly correlate the surface structure observed by STM with reactivity measurements from a mass spectrometer. The in situ STM experiments can be combined with ex situ UHV sample preparation and analysis techniques, including ion bombardment, thin film deposition, low-energy electron diffraction and x-ray photoelectron spectroscopy. The performance of the instrument is demonstrated by atomically resolved images of Au(111) and atom-row resolution on Pt(110), both under high-pressure and high-temperature conditions.

NATURVETENSKAP -- Fysik -- Den kondenserade materiens fysik (hsv//swe)
NATURAL SCIENCES -- Physical Sciences -- Condensed Matter Physics (hsv//eng)

By the author/editor: Herbschleb, C. T ...; Van Der Tuijn, P ...; Roobol, S. B.; Navarro, V.; Bakker, J. W.; Liu, Q.; show more...; Stoltz, David; Cañas-Ventura, M ...; Verdoes, G.; Van Spronsen, M. ...; Bergman, M.; Crama, L.; Taminiau, I.; Ofitserov, A.; Van Baarle, G. J ...; Frenken, J. W. M ...; show less...

About the subject

NATURAL SCIENCES: NATURAL SCIENCES; and Physical Science ...; and Condensed Matter ...

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