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- Van Chien, Trinh (author)
Outage Probability Analysis of IRS-Assisted Systems Under Spatially Correlated Channels
- Article/chapterEnglish2021
Publisher, publication year, extent ...
- Institute of Electrical and Electronics Engineers (IEEE),2021
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- LIBRIS-ID:oai:DiVA.org:kth-312628
- https://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-312628URI
- https://doi.org/10.1109/LWC.2021.3082409DOI
Supplementary language notes
- Language:English
- Summary in:English
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- QC 20220520
- This letter investigates the impact of spatial channel correlation on the outage probability of intelligent reflecting surface (IRS)-assisted single-input single-output (SISO) communication systems. In particular, we derive a novel closed-form expression of the outage probability for arbitrary phase shifts and correlation matrices of the indirect channels. To shed light on the impact of the spatial correlation, we further attain the closed-form expressions for two common scenarios met in the literature when the large-scale fading coefficients are expressed by the loss over a propagation distance. Numerical results validate the tightness and effectiveness of the closed-form expressions. Furthermore, the spatial correlation offers significant decreases in the outage probability as the direct channel is blocked.
Subject headings and genre
- TEKNIK OCH TEKNOLOGIER Elektroteknik och elektronik Signalbehandling hsv//swe
- ENGINEERING AND TECHNOLOGY Electrical Engineering, Electronic Engineering, Information Engineering Signal Processing hsv//eng
- Intelligent reflecting surface
- Outage probability
- Spatial correlation
Added entries (persons, corporate bodies, meetings, titles ...)
- Papazafeiropoulos, Anastasios K. (author)
- Tu, Lam Thanh (author)
- Chopra, Ribhu (author)
- Chatzinotas, Symeon (author)
- Ottersten, Björn,1961-SnT, University of Luxembourg, Luxembourg City, 1855, Luxembourg,Signal Processing(Swepub:kth)u120hb53 (author)
- SnT, University of Luxembourg, Luxembourg City, 1855, LuxembourgSignal Processing (creator_code:org_t)
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- In:IEEE Wireless Communications Letters: Institute of Electrical and Electronics Engineers (IEEE)10:8, s. 1815-18192162-23372162-2345
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