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Contactless RF Probe Interconnect Technology Enabling Broadband Testing to the Terahertz Range

Rivera-Lavado, Alejandro (author)
Univ Carlos III Madrid, Dept Teoria Senal & Comunicac, Leganes 28911, Spain.;Yebes Observ, Inst Geog Nacl, Direcc Gen, Yebes 19141, Spain.
Ali, Muhsin (author)
Univ Carlos III Madrid, Dept Tecnol Elect, Madrid 28911, Spain.
Gallego-Cabo, Daniel (author)
Univ Carlos III Madrid, Dept Tecnol Elect, Madrid 28911, Spain.
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Garcia-Munoz, Luis-Enrique (author)
Univ Carlos III Madrid, Dept Teoria Senal & Comunicac, Madrid 28911, Spain.
Lioubtchenko, Dmitri (author)
KTH,Mikro- och nanosystemteknik
Carpintero, Guillermo (author)
Univ Carlos III Madrid, Dept Tecnol Elect, Madrid 28911, Spain.
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Univ Carlos III Madrid, Dept Teoria Senal & Comunicac, Leganes 28911, Spain;Yebes Observ, Inst Geog Nacl, Direcc Gen, Yebes 19141, Spain. Univ Carlos III Madrid, Dept Tecnol Elect, Madrid 28911, Spain. (creator_code:org_t)
Institute of Electrical and Electronics Engineers (IEEE), 2023
2023
English.
In: IEEE Transactions on Terahertz Science and Technology. - : Institute of Electrical and Electronics Engineers (IEEE). - 2156-342X .- 2156-3446. ; 13:1, s. 34-43
  • Journal article (peer-reviewed)
Abstract Subject headings
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  • Radiofrequency (RF) probes based on 50-omega planar transmission lines play a key role in almost every stage of RF device development, establishing the physical contact between high-end instrumentation and the device. With the continuous downscaling of semiconductor technologies to reach into the millimeter-wave (30-300 GHz) and Terahertz (300 GHz to 3 THz) bands and devices exhibiting broader frequency response, current RF probe technology is the Achilles heel for precise and repeatable measurements. Here, we propose a novel RF probe technology based on the near-field coupling of single-mode dielectric waveguide structures, which according to our full-wave simulations provide an extremely broad frequency range covering from 0 Hz up to 340 GHz, the largest continuous bandwidth reported to date. A concept demonstrator using this approach shows contactless RF probing on test structures, which shows the path toward continuous measurements across the microwave, millimeter-wave, and Terahertz range.

Subject headings

TEKNIK OCH TEKNOLOGIER  -- Elektroteknik och elektronik (hsv//swe)
ENGINEERING AND TECHNOLOGY  -- Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
TEKNIK OCH TEKNOLOGIER  -- Elektroteknik och elektronik -- Telekommunikation (hsv//swe)
ENGINEERING AND TECHNOLOGY  -- Electrical Engineering, Electronic Engineering, Information Engineering -- Telecommunications (hsv//eng)

Keyword

Probes
Radio frequency
Dielectrics
Dielectric measurement
Connectors
Optical waveguides
Rectangular waveguides
Contactless probe
dielectric rod waveguide (DRW)
terahertz
ultra-wideband interconnection

Publication and Content Type

ref (subject category)
art (subject category)

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