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Effects of Processi...
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Simatos, DimitriosOptoelectronics Group, Cavendish Laboratory, University of Cambridge, Cambridge, CB3 0HE, UK; Yusuf Hamied Department of Chemistry, University of Cambridge, Cambridge, CB2 1EW, UK
(author)
Effects of Processing-Induced Contamination on Organic Electronic Devices
- Article/chapterEnglish2023
Publisher, publication year, extent ...
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Wiley,2023
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LIBRIS-ID:oai:DiVA.org:kth-348560
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https://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-348560URI
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https://doi.org/10.1002/smtd.202300476DOI
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https://urn.kb.se/resolve?urn=urn:nbn:se:ri:diva-66723URI
Supplementary language notes
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Language:English
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Summary in:English
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Subject category:ref swepub-contenttype
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Subject category:art swepub-publicationtype
Notes
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QC 20240626
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D.S. and I.E.J. contributed equally to this work. The authors acknowledge funding from the Engineering and Physical Sciences Research Council (EPSRC) (EP/R031894/1, EP/R032025/1, EP/W017091/1). D.S. acknowledges support from the EPSRC Centre for Doctoral Training (CDT) in Sensor Technologies and Applications (EP/L015889/1). I.E.J. acknowledges funding from a Royal Society Newton International Fellowship. A.S. and R.M.O. acknowledge funding from the European Union's Horizon 2020 research and innovation program under the Marie Skłodowska‐Curie grant, MultiStem (No. 895801). D.V. acknowledges the Royal Society for funding in the form of a Royal Society University Research Fellowship (Royal Society Reference No. URF\R1\201590). M.G. and H.S. acknowledge funding from the European Union's Horizon 2020 research and innovation program under the Marie Skłodowska‐Curie grant agreement, UHMob (No 811284). G.S. thanks the Belgian National Fund for Scientific Research (FNRS) for financial support through research project COHERENCE2 No. F.4536.23. G.S. is an FNRS Research Associate. G.S. acknowledges financial support from the Francqui Foundation (Francqui Start‐Up Grant). I.B.D. acknowledges support from the EPSRC Cambridge NanoDTC (EP/L015978/1). H.S. acknowledges funding from a Royal Society Research Professorship (RP\R1\201082). The authors acknowledge support from the Henry Royce Institute facilities grant (EP/P024947/1), as well as the Sir Henry Royce Institute recurrent grant (EP/R00661X/1) for the use of the ambient cluster tool and the EQCM.
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Organic semiconductors are a family of pi-conjugated compounds used in many applications, such as displays, bioelectronics, and thermoelectrics. However, their susceptibility to processing-induced contamination is not well understood. Here, it is shown that many organic electronic devices reported so far may have been unintentionally contaminated, thus affecting their performance, water uptake, and thin film properties. Nuclear magnetic resonance spectroscopy is used to detect and quantify contaminants originating from the glovebox atmosphere and common laboratory consumables used during device fabrication. Importantly, this in-depth understanding of the sources of contamination allows the establishment of clean fabrication protocols, and the fabrication of organic field effect transistors (OFETs) with improved performance and stability. This study highlights the role of unintentional contaminants in organic electronic devices, and demonstrates that certain stringent processing conditions need to be met to avoid scientific misinterpretation, ensure device reproducibility, and facilitate performance stability. The experimental procedures and conditions used herein are typical of those used by many groups in the field of solution-processed organic semiconductors. Therefore, the insights gained into the effects of contamination are likely to be broadly applicable to studies, not just of OFETs, but also of other devices based on these materials.
Subject headings and genre
Added entries (persons, corporate bodies, meetings, titles ...)
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Jacobs, Ian E.Optoelectronics Group, Cavendish Laboratory, University of Cambridge, Cambridge, CB3 0HE, UK
(author)
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Dobryden, IlliaRISE,Material- och ytdesign,RISE Research Institutes of Sweden, Division of Bioeconomy and Health, Department of Material and Surface Design, RISE Research Institutes of Sweden, 11486, Stockholm, Sweden(Swepub:ri)illiado@ri.se
(author)
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Nguyen, MałgorzataOptoelectronics Group, Cavendish Laboratory, University of Cambridge, Cambridge, CB3 0HE, UK
(author)
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Savva, AchilleasDepartment of Chemical Engineering and Biotechnology, University of Cambridge, Cambridge, CB3 OAS, UK
(author)
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Venkateshvaran, DeepakOptoelectronics Group, Cavendish Laboratory, University of Cambridge, Cambridge, CB3 0HE, UK
(author)
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Nikolka, MarkOptoelectronics Group, Cavendish Laboratory, University of Cambridge, Cambridge, CB3 0HE, UK
(author)
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Charmet, JérômeSchool of Engineering−HE-Arc Ingénierie, HES-SO University of Applied Sciences Western Switzerland, 2000, Neuchâtel, Switzerland
(author)
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Spalek, Leszek J.Optoelectronics Group, Cavendish Laboratory, University of Cambridge, Cambridge, CB3 0HE, UK
(author)
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Gicevičius, MindaugasOptoelectronics Group, Cavendish Laboratory, University of Cambridge, Cambridge, CB3 0HE, UK
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Zhang, YouchengOptoelectronics Group, Cavendish Laboratory, University of Cambridge, Cambridge, CB3 0HE, UK
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Schweicher, GuillaumeLaboratoire de Chimie des Polymères, Faculté des Sciences, Université Libre de Bruxelles (ULB), 1050, Bruxelles, Belgium
(author)
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Howe, Duncan J.Yusuf Hamied Department of Chemistry, University of Cambridge, Cambridge, CB2 1EW, UK
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Ursel, SarahOptoelectronics Group, Cavendish Laboratory, University of Cambridge, Cambridge, CB3 0HE, UK
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Armitage, JohnOptoelectronics Group, Cavendish Laboratory, University of Cambridge, Cambridge, CB3 0HE, UK
(author)
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Dimov, Ivan B.Electrical Engineering Division, Department of Engineering, University of Cambridge, Cambridge, CB3 0FA, UK
(author)
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Kraft, UlrikeDepartment of Molecular Electronics, Max Planck Institute for Polymer Research, 55128, Mainz, Germany
(author)
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Zhang, WeiminPhysical Science and Engineering Division, King Abdullah University of Science and Technology (KAUST), Thuwal, 23955-6900, Saudi Arabia
(author)
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Alsufyani, MaryamDepartment of Chemistry, University of Oxford, Oxford, OX1 3TA, UK
(author)
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McCulloch, IainPhysical Science and Engineering Division, King Abdullah University of Science and Technology (KAUST), Thuwal, 23955-6900, Saudi Arabia; Department of Chemistry, University of Oxford, Oxford, OX1 3TA, UK
(author)
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Owens, Róisín M.Department of Chemical Engineering and Biotechnology, University of Cambridge, Cambridge, CB3 OAS, UK
(author)
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Claesson, Per M.KTH,Yt- och korrosionsvetenskap(Swepub:kth)u15tzvsb
(author)
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Knowles, Tuomas P.J.Yusuf Hamied Department of Chemistry, University of Cambridge, Cambridge, CB2 1EW, UK
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Sirringhaus, HenningOptoelectronics Group, Cavendish Laboratory, University of Cambridge, Cambridge, CB3 0HE, UK
(author)
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Optoelectronics Group, Cavendish Laboratory, University of Cambridge, Cambridge, CB3 0HE, UK; Yusuf Hamied Department of Chemistry, University of Cambridge, Cambridge, CB2 1EW, UKOptoelectronics Group, Cavendish Laboratory, University of Cambridge, Cambridge, CB3 0HE, UK
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In:Small Methods: Wiley7:112366-9608
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