A Condition Monitoring Scheme for Semiconductor Devices in Modular Multilevel Converters with Cascaded H-Bridge Submodules

• In this paper, a novel online semiconductor device monitoring scheme is presented. The condition monitoring (CM) scheme is based on measuring the ON-state voltage drop of semiconductor devices, and tracking the changes in their ON-state resistance. The proposed solution measures the ON-state voltage of semiconductor devices at a controlled and readily measurable temperature. This allows for accurate CM of semiconductors as it decouples temperature related and degradation related changes in the ON-state voltage. The temperature decoupling is achieved using natural switching redundancies available to modular multilevel converter systems. Hence, the proposed CM scheme does not interfere with the output voltages and currents generated by the converter. 

Ämnesord

TEKNIK OCH TEKNOLOGIER  -- Elektroteknik och elektronik (hsv//swe)

ENGINEERING AND TECHNOLOGY  -- Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)

TEKNIK OCH TEKNOLOGIER  -- Elektroteknik och elektronik -- Annan elektroteknik och elektronik (hsv//swe)

ENGINEERING AND TECHNOLOGY  -- Electrical Engineering, Electronic Engineering, Information Engineering -- Other Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)

Nyckelord

Cascaded H-Bridge

Condition monitoring

Degradation

Device characterisation

Diagnostics

Estimation technique

FACTS

Modular Multilevel Converters (MMC)

Reliability

Semiconductor device

Thermal model

Bridge circuits

Flexible AC transmission systems

Power electronics

Semiconductor devices

Condition

Device characterization

Diagnostic

Estimation techniques

Modular multilevel converter

Modulars

Multilevel converter

Submodules

Power converters

Publikations- och innehållstyp

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