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Current Gain Degrad...
Current Gain Degradation in 4H-SiC Power BJTs
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- Buono, Benedetto (författare)
- KTH,Integrerade komponenter och kretsar
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- Ghandi, Reza (författare)
- KTH,Integrerade komponenter och kretsar
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- Domeij, Martin (författare)
- KTH,Integrerade komponenter och kretsar
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visa fler...
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- Malm, B. Gunnar (författare)
- KTH,Integrerade komponenter och kretsar
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- Zetterling, Carl-Mikael (författare)
- KTH,Integrerade komponenter och kretsar
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- Östling, Mikael (författare)
- KTH,Integrerade komponenter och kretsar
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(creator_code:org_t)
- Trans Tech Publications Inc. 2011
- 2011
- Engelska.
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Ingår i: Materials Science Forum. - : Trans Tech Publications Inc.. - 0255-5476 .- 1662-9752. ; 679-680, s. 702-705
- Relaterad länk:
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https://urn.kb.se/re...
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visa fler...
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https://doi.org/10.4...
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Abstract
Ämnesord
Stäng
- SiC airs are very attractive for high power application, but long term stability is still problematic and it could prohibit commercial production of these devices. The aim of this paper is to investigate the current gain degradation in BJTs with no significant degradation of the on-resistance. Electrical measurements and simulations have been used to characterize the behavior of the BJT during the stress test. Current gain degradation occurs, the gain drops from 58 before stress to 43 after 40 hours, and, moreover, the knee current shows fluctuations in its value during the first 20 hours. Current gain degradation has been attributed to increased interface traps or reduced lifetime in the base-emitter region or small stacking faults in the base-emitter region, while fluctuations of the knee current might be due to stacking faults in the collector region.
Ämnesord
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik -- Annan elektroteknik och elektronik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering -- Other Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
Nyckelord
- bipolar transistor
- current gain degradation
- interface traps
- lifetime
- stacking fault
- TECHNOLOGY
- TEKNIKVETENSKAP
Publikations- och innehållstyp
- ref (ämneskategori)
- art (ämneskategori)
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