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  • Lemme, Max C.,1970-AMO GmbH, AMICA, Aachen, Germany (author)

Complementary metal oxide semiconductor integration of epitaxial Gd(2)O(3)

  • Article/chapterEnglish2009

Publisher, publication year, extent ...

  • American Vacuum Society,2009
  • printrdacarrier

Numbers

  • LIBRIS-ID:oai:DiVA.org:kth-50536
  • https://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-50536URI
  • https://doi.org/10.1116/1.3054350DOI

Supplementary language notes

  • Language:English
  • Summary in:English

Part of subdatabase

Classification

  • Subject category:ref swepub-contenttype
  • Subject category:art swepub-publicationtype

Notes

  • In this paper, epitaxial gadolinium oxide (Gd(2)O(3)) is reviewed as a potential high-K gate dielectric, both "as deposited" by molecular beam epitaxy as well as after integration into complementary metal oxide semiconductor (CMOS) processes. The material shows promising intrinsic properties, meeting critical ITRS targets for leakage current densities even at subnanometer equivalent oxide thicknesses. These epitaxial oxides can be integrated into a CMOS platform by a "gentle" replacement gate process. While high temperature processing potentially degrades the material, a route toward thermally stable epitaxial Gd(2)O(3) gate dielectrics is explored by carefully controlling the annealing conditions.

Subject headings and genre

Added entries (persons, corporate bodies, meetings, titles ...)

  • Gottlob, H. D. B. (author)
  • Echtermeyer, T. J. (author)
  • Schmidt, M. (author)
  • Kurz, H. (author)
  • Endres, R. (author)
  • Schwalke, U. (author)
  • Czernohorkky, M. (author)
  • Tetzlaff, D. (author)
  • Osten, H. J. (author)
  • AMO GmbH, AMICA, Aachen, Germany (creator_code:org_t)

Related titles

  • In:Journal of Vacuum Science & Technology B: American Vacuum Society27:1, s. 258-2611071-10231520-8567

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