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Buried tantalate-niobate microwave varactors

Bonetti, Stefano (author)
KTH,Materialfysik
Kim, Jang-Yong (author)
KTH,Mikroelektronik och tillämpad fysik, MAP
Khartsev, Sergiy (author)
KTH,Mikroelektronik och tillämpad fysik, MAP
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Grishin, Alexander (author)
KTH,Mikroelektronik och tillämpad fysik, MAP
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 (creator_code:org_t)
2007
2007
English.
In: 2006 15TH IEEE INTERNATIONAL SYMPOSIUM ON APPLICATIONS OF FERROELECTRICS. - 9781424413317 ; , s. 347-350
  • Conference paper (peer-reviewed)
Abstract Subject headings
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  • We present characteristics of microwave variable capacitors (varactors) buried in 2.5 mu m thick AgTa0.5Nb0.5O3 (ATN) film pulsed laser deposited on sapphire single crystal. 2 gm gap interdigital capacitors (IDC) were fabricated by photolithographic, dry etching and lift-off processes. For comparison, similar IDCs were also defined on top of ATN film. Capacitance and loss tangent have been determined using a modified de-embedding technique in the microwave range 25 MHz - 40 GHz. Buried structures show higher values of capacitance and tunability, keeping the same level of losses compared to standard topped devices and resulting in an increased K-factor = tunability/tan delta. Experimental results are explained within equivalent circuit model. Besides the increased performance, the new design avoids the need of a successive planarization step, which could be required in an integration process.

Subject headings

TEKNIK OCH TEKNOLOGIER  -- Elektroteknik och elektronik (hsv//swe)
ENGINEERING AND TECHNOLOGY  -- Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)

Keyword

Silver-tantalate-niobate
voltage tunability
buried interdigital capacitors
Electrical engineering, electronics and photonics
Elektroteknik, elektronik och fotonik

Publication and Content Type

ref (subject category)
kon (subject category)

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Bonetti, Stefano
Kim, Jang-Yong
Khartsev, Sergiy
Grishin, Alexand ...
About the subject
ENGINEERING AND TECHNOLOGY
ENGINEERING AND ...
and Electrical Engin ...
Articles in the publication
2006 15TH IEEE I ...
By the university
Royal Institute of Technology

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