id:"swepub:oai:DiVA.org:kth-7591"
Search: id:"swepub:oai:DiVA.org:kth-7591" > Histogram Tests for...
- 1 of 1
- Previous record
- Next record
- To hitlist
- Björsell, NiclasHögskolan i Gävle,Ämnesavdelningen för elektronik (author)
Histogram Tests for Wideband Applications
- Article/chapterEnglish2008
Publisher, publication year, extent ...
- 2008
- printrdacarrier
Numbers
- LIBRIS-ID:oai:DiVA.org:kth-7591
- https://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-7591URI
- https://doi.org/10.1109/TIM.2007.908274DOI
- https://urn.kb.se/resolve?urn=urn:nbn:se:hig:diva-2519URI
Supplementary language notes
- Language:English
- Summary in:English
Part of subdatabase
- SwePubSwePub
Classification
Notes
- QC 20100629
- Characterization and testing of analog-to-digital converters (ADCs) are important for many reasons. A histogram test is a common method to characterize the linearity features of an ADC. Two commonly used stimulus signals are sine waves and Gaussian noise. This paper presents a metrological comparison between Gaussian and sine-wave histogram tests for wide-band applications, that is, we evaluate the performance of the characterization of the ADC and the usability of postcorrection. A postcorrection procedure involves the characterization of the ADC nonlinearity and then the use of this information by processing the ADC output samples to remove the distortion. The results show that the Gaussian histogram test gives reasonable accuracy in measuring nonlinearities. However, it does not result in a suitable model for postcorrection in wideband applications. A single-tone sine-wave histogram will be a better basis for postcorrection. The best result can be obtained if the lookup table is trained with several single-tone sine waves in the frequency band.
Subject headings and genre
- TEKNIK OCH TEKNOLOGIER Elektroteknik och elektronik hsv//swe
- ENGINEERING AND TECHNOLOGY Electrical Engineering, Electronic Engineering, Information Engineering hsv//eng
- TEKNIK OCH TEKNOLOGIER Elektroteknik och elektronik Annan elektroteknik och elektronik hsv//swe
- ENGINEERING AND TECHNOLOGY Electrical Engineering, Electronic Engineering, Information Engineering Other Electrical Engineering, Electronic Engineering, Information Engineering hsv//eng
- analog-to-digital converters (ADCs); histogram; measurements; test
- Telecommunication
- Telekommunikation
- Electronics
Added entries (persons, corporate bodies, meetings, titles ...)
- Händel, Peter,1962-KTH,Signalbehandling,ACCESS Linnaeus Centre,Signal Processing Laboratory, Royal Institute of Technology, Stockholm, Sweden(Swepub:hig)perhal (author)
- Högskolan i GävleÄmnesavdelningen för elektronik (creator_code:org_t)
Related titles
- In:IEEE Transactions on Instrumentation and Measurement57:1, s. 70-750018-94561557-9662
Internet link
Find in a library
- IEEE Transactions on Instrumentation and Measurement (Search for host publication in LIBRIS)
To the university's database
- 1 of 1
- Previous record
- Next record
- To hitlist
Find more in SwePub
- By the author/editor
- Björsell, Niclas
- Händel, Peter, 1 ...
- About the subject
-
- ENGINEERING AND TECHNOLOGY
- ENGINEERING AND ...
- and Electrical Engin ...
-
- ENGINEERING AND TECHNOLOGY
- ENGINEERING AND ...
- and Electrical Engin ...
- and Other Electrical ...
- Articles in the publication
- IEEE Transaction ...
- By the university
- Royal Institute of Technology
- University of Gävle
Search outside SwePub
- Extend your search to:
- Google Book Search
- Google Scholar
Kungliga biblioteket hanterar dina personuppgifter i enlighet med EU:s dataskyddsförordning (2018), GDPR. Läs mer om hur det funkar här.
Så här hanterar KB dina uppgifter vid användning av denna tjänst.
- Copyright © LIBRIS - National Library Systems
- LIBRIS.kb.se
