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Charge accumulation...
Charge accumulation at InAs surfaces
- Article/chapterEnglish1996
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LIBRIS-ID:oai:DiVA.org:kth-84165
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https://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-84165URI
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https://doi.org/10.1103/PhysRevLett.76.3626DOI
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Language:English
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Summary in:English
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Subject category:ref swepub-contenttype
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Subject category:art swepub-publicationtype
Notes
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NR 20140805
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Angle-resolved photoelectron spectroscopy has been used to directly prove the existence of a charge accumulation layer at clean InAs surfaces. The formation of an accumulation layer is shown to be a common property of polar InAs surfaces, with the precise surface Fermi level position above the conduction band minimum determined by the surface geometry. The emission from states in the accumulation layer is studied with respect to its photon energy and angular dependence.
Added entries (persons, corporate bodies, meetings, titles ...)
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Andersson, C B M
(author)
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Hakansson, M C
(author)
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Kanski, J
(author)
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Ilver, L
(author)
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Karlsson, Ulf Omaterialfysik
(author)
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materialfysik
(creator_code:org_t)
Related titles
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In:Physical Review Letters76:19, s. 3626-36290031-90071079-7114
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