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Method to extract t...
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Jonsson, B J
(författare)
Method to extract the critical current density and the flux-creep exponent in high-T-c thin films using ac susceptibility measurements
- Artikel/kapitelEngelska1998
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LIBRIS-ID:oai:DiVA.org:kth-84186
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https://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-84186URI
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https://doi.org/10.1103/PhysRevB.58.5862DOI
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Språk:engelska
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Sammanfattning på:engelska
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Ämneskategori:ref swepub-contenttype
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Ämneskategori:art swepub-publicationtype
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NR 20140805
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High-precision ac susceptibility measurements have been made on high-quality Hg-1212 thin films. A method to analyze chi(1)'(T,H-0,f) and chi(1)" (T,H-0,f) and extract the temperature dependence of the critical current density J(c)(T), as well as the temperature and field-dependent flux-creep exponent n(T,H-0), is presented. With specific measurements at external ac fields Ho in the range 7-100 Oe(rms) we determine the temperature dependence of the critical current density from a single temperature scan. The obtained temperature dependence, J(c)(T), is found to be in good agreement with data obtained from measurements using the traditional "loss-maximum" approach. In addition we present a method to extract the temperature and ac field-dependent flux-creep exponent n(T,H-0) from a set of temperature scans taken at different cc fields and driving frequencies. The observed power law describing the frequency dependence of chi' is consistent with a current-dependent effective activation energy of the form U(J)= U(0)ln(J(c)/J). Furthermore, the flux creep is found to increase with ac field and with temperature except at about 20-30 K below T-c, where our data suggest a slowing down of the flux creep.
Biuppslag (personer, institutioner, konferenser, titlar ...)
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Rao, K V
(författare)
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Yun, S H
(författare)
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Karlsson, Ulf OKTH,Skolan för informations- och kommunikationsteknik (ICT),Materialfysik
(författare)
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KTHSkolan för informations- och kommunikationsteknik (ICT)
(creator_code:org_t)
Sammanhörande titlar
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Ingår i:Physical Review B Condensed Matter58:9, s. 5862-58670163-18291095-3795
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