Residual stress evolution during decomposition of Ti(1-x)Al (x)N coatings using high-energy x-rays

• Residual stresses and microstructural changes during phase separation in Ti33Al67N coatings were examined using microfocused high energy x-rays from a synchrotron source. The transmission geometry allowed simultaneous acquisition of x-ray diffraction data over 360 degrees and revealed that the decomposition at elevated temperatures occurred anisotropically, initiating preferentially along the film plane. The as-deposited compressive residual stress in the film plane first relaxed with annealing, before dramatically increasing concurrently with the initial stage of phase separation where metastable, nm-scale c-AlN platelets precipitated along the film direction. These findings were further supported from SAXS analyses.

Ämnesord

TEKNIK OCH TEKNOLOGIER  -- Materialteknik -- Metallurgi och metalliska material (hsv//swe)

ENGINEERING AND TECHNOLOGY  -- Materials Engineering -- Metallurgy and Metallic Materials (hsv//eng)

TEKNIK OCH TEKNOLOGIER  -- Materialteknik -- Annan materialteknik (hsv//swe)

ENGINEERING AND TECHNOLOGY  -- Materials Engineering -- Other Materials Engineering (hsv//eng)

Nyckelord

ceramic coatings

TiAlN

WAXS

SAXS

x-ray scattering

small-angle x-ray scattering

synchrotron radiation

x-ray diffraction

TECHNOLOGY

Materialteknik

Publikations- och innehållstyp

ref (ämneskategori)

kon (ämneskategori)