X-γ Ray Spectroscopy With Semi-Insulating 4H-Silicon Carbide

• Radiation detectors on a semi-insulating (SI) 4H siliconcarbide (SiC) wafer have been manufactured and characterizedwith X and photons in the range 8–59 keV. The detectors were 400 μm diameter circular Ni-SiC junctions on an SI 4H-SiC wafer thinned to 70 μm. Dark current densities of 3.5 nA/cm2 at 20 °C and 0.3 μA/cm2 at 104 °C with an internal electric field of 7 kV/cm have been measured. X-γ ray spectra from 241Am have been acquired at room temperature with pulser line width of 756 eV FWHM. The charge collection efficiency (CCE) has been measured under different experimental conditions with a maximum CCE = 75 % at room temperature. Polarization effects have been observed, and the dependence of CCE on time and temperature has been measured and analyzed. The charge trapping has been described by the Hecht model with a maximum totalmean drift length of 107 μm at room temperature.

Subject headings

NATURVETENSKAP  -- Fysik (hsv//swe)

NATURAL SCIENCES  -- Physical Sciences (hsv//eng)

Keyword

Charge collection efficiency (CCE)

Polarization effect

Radiation detectors

Semiconductor detectors

Semi-insulating (SI) crystals

Silicon carbide (SiC)

X-ray spectroscopy

Publication and Content Type

ref (subject category)

art (subject category)