Silicon Carbide Microstrip Detectors for High Resolution X-Ray Spectroscopy

• Silicon Carbide (SiC) is a wide bandgap semiconductor with outstanding physical properties for realizing ionizing radiation detectors. We present the manufacturing, electrical and spectroscopic characterization of a prototype SiC microstrip detector constituted by 32 strips, 2 mm long, 25 μm wide with 55 μm pitch. The detectors have been fabricated on 115 μm thick undoped epitaxial 4H-SiC using Ni-SiC Schottky junctions. The measured leakage currents are below 5 fA at 25 °C and 0.6 pA at 107 °C with internal electric fields up to 30 kV/cm. X-ray spectra from 55Fe and 241Am with energy resolution of 224 eV FWHM and 249 eV FWHM (12-13.5 electrons r.m.s.) have been acquired at 20 °C and 80 °C, respectively.

Ämnesord

NATURVETENSKAP  -- Fysik (hsv//swe)

NATURAL SCIENCES  -- Physical Sciences (hsv//eng)

Nyckelord

Silicon carbide

Microstrip detectors

X-ray spectroscopy

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