Search: id:"swepub:oai:DiVA.org:liu-111506" >
EPR Identification ...
-
Isoya, JUniversity of Tsukuba, Japan
(author)
EPR Identification of Intrinsic Defects in SiC
- Article/chapterEnglish2011
Publisher, publication year, extent ...
-
2011-03-28
-
John Wiley & Sons,2011
-
printrdacarrier
Numbers
-
LIBRIS-ID:oai:DiVA.org:liu-111506
-
https://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-111506URI
-
https://doi.org/10.1002/9783527629053.ch6DOI
Supplementary language notes
Part of subdatabase
Classification
-
Subject category:vet swepub-contenttype
-
Subject category:kap swepub-publicationtype
Subject headings and genre
Added entries (persons, corporate bodies, meetings, titles ...)
-
Umeda, TUniversity of Tsukuba, Japan
(author)
-
Mizuochi, NUniversity of Tsukuba, Japan
(author)
-
Son, Nguyen TienLinköpings universitet,Halvledarmaterial,Tekniska högskolan(Swepub:liu)nguso90
(author)
-
Janzén, ErikLinköpings universitet,Halvledarmaterial,Tekniska högskolan(Swepub:liu)erija14
(author)
-
Ohshima, TJapan Atomic Energy Agency, Takasaki, Japan
(author)
-
University of Tsukuba, JapanHalvledarmaterial
(creator_code:org_t)
Related titles
-
In:Silicon Carbide: John Wiley & Sons, s. 147-17997835274095329783527629053
Internet link
Find in a library
To the university's database