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3D-Morphology Recon...
3D-Morphology Reconstruction of Nanoscale Phase-Separation in Polymer Memory Blends
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- Khikhlovskyi, Vsevolod (author)
- Eindhoven University of Technology, Netherlands; TNO, Netherlands
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- van Breemen, Albert J. J. M. (author)
- Holst Centre, TNO-The Dutch Organization for Applied Scientific Research, The Netherlands
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- Michels, Jasper J. (author)
- Max Planck Institute for Polymer Research (MPI), Germany
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- Janssen, Rene A. J. (author)
- Department of Applied Physics, Eindhoven University of Technology, The Netherlands
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- Gelinck, Gerwin H. (author)
- Department of Applied Physics, Eindhoven University of Technology, The Netherlands; Holst Centre, TNO-The Dutch Organization for Applied Scientific Research, The Netherlands
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- Kemerink, Martijn (author)
- Linköpings universitet,Komplexa material och system,Tekniska högskolan,Department of Applied Physics, Eindhoven University of Technology, The Netherlands
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(creator_code:org_t)
- 2015-06-17
- 2015
- English.
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In: Journal of Polymer Science Part B. - : John Wiley & Sons. - 0887-6266 .- 1099-0488. ; 53:17, s. 1231-1237
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Abstract
Subject headings
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- In many organic electronic devices functionality is achieved by blending two or more materials, typically polymers or molecules, with distinctly different optical or electrical properties in a single film. The local scale morphology of such blends is vital for the device performance. Here, a simple approach to study the full 3D morphology of phase-separated blends, taking advantage of the possibility to selectively dissolve the different components is introduced. This method is applied in combination with AFM to investigate a blend of a semiconducting and ferroelectric polymer typically used as active layer in organic ferroelectric resistive switches. It is found that the blend consists of a ferroelectric matrix with three types of embedded semiconductor domains and a thin wetting layer at the bottom electrode. Statistical analysis of the obtained images excludes the presence of a fourth type of domains. The criteria for the applicability of the presented technique are discussed. (c) 2015 Wiley Periodicals, Inc.
Subject headings
- NATURVETENSKAP -- Fysik (hsv//swe)
- NATURAL SCIENCES -- Physical Sciences (hsv//eng)
Keyword
- AFM; phase separation; organic memory; selective dissolution; thin films
Publication and Content Type
- ref (subject category)
- art (subject category)
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