XPS guide: Charge neutralization and binding energy referencing for insulating samples

Funding Agencies|Swedish Research Council VRSwedish Research Council [2018-03957]; Carl Tryggers Stiftelse Contract [CTS 17:166]; DOE Office of Biological and Environmental ResearchUnited States Department of Energy (DOE)
This guide deals with methods to control surface charging during XPS analysis of insulating samples and approaches to extracting useful binding energy information. The guide summarizes the causes of surface charging, how to recognize when it occurs, approaches to minimize charge buildup, and methods used to adjust or correct XPS photoelectron binding energies when charge control systems are used. There are multiple ways to control surface charge buildup during XPS measurements, and examples of systems on advanced XPS instruments are described. There is no single, simple, and foolproof way to extract binding energies on insulating material, but advantages and limitations of several approaches are described. Because of the variety of approaches and limitations of each, it is critical for researchers to accurately describe the procedures that have been applied in research reports and publications.

Artyushkova, KaterynaPhys Elect, MN 55317 USA (författare)
Cohen, HagaiWeizmann Inst Sci, Israel (författare)
Easton, Christopher D.CSIRO Mfg, Australia (författare)
Engelhard, MarkPacific Northwest Natl Lab, WA 99352 USA (författare)
Gengenbach, Thomas R.CSIRO Mfg, Australia (författare)
Greczynski, GrzegorzLinköpings universitet,Tunnfilmsfysik,Tekniska fakulteten(Swepub:liu)grzgr49 (författare)
Mack, PaulThermo Fisher Sci, England (författare)
Morgan, David J.Cardiff Univ, Wales (författare)
Roberts, AdamKratos Analyt Ltd, England (författare)
Pacific Northwest Natl Lab, WA 99352 USAPhys Elect, MN 55317 USA (creator_code:org_t)

Ingår i:Journal of Vacuum Science & Technology. A. Vacuum, Surfaces, and Films: A V S AMER INST PHYSICS38:30734-21011520-8559

Av författaren/redakt...: Baer, Donald R.; Artyushkova, Kat ...; Cohen, Hagai; Easton, Christop ...; Engelhard, Mark; Gengenbach, Thom ...; visa fler...; Greczynski, Grze ...; Mack, Paul; Morgan, David J.; Roberts, Adam; visa färre...

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