Electronic structure of buried Si layers in GaAs(001) as studied by soft-x-ray emission

• It is demonstrated that it is possible to investigate details of the electronic structure of an internal atomic monolayer using soft-x-ray-emission spectroscopy. The local and partial density of states of one monolayer and three monolayers of Si, embedded deep below a GaAs(001) surface, was extracted. Clear differences to the density of states for bulk Si were observed.

Subject headings

NATURVETENSKAP  -- Biologi (hsv//swe)

NATURAL SCIENCES  -- Biological Sciences (hsv//eng)

NATURVETENSKAP  -- Fysik (hsv//swe)

NATURAL SCIENCES  -- Physical Sciences (hsv//eng)

Keyword

NATURAL SCIENCES

NATURVETENSKAP

Biology

Biologi

SPECTROSCOPY; DENSITIES; SPECTRA; STATES; GAAS

Publication and Content Type

ref (subject category)

art (subject category)