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The impact of surface defects on SiC Schottky and ohmic contact formation
- Brillson, L.J. (author)
- Tumakha, S.P. (author)
- Gao, M. (author)
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- Ewing, D.J. (author)
- Porter, L.M. (author)
- Okojie, R.S. (author)
- Zhang, M. (author)
- Pirouz, P. (author)
- Ma, X. (author)
- Sudharshan, T.S. (author)
- Onishi, T. (author)
- Tsukimoto, S. (author)
- Murakami, M. (author)
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- (creator_code:org_t)
- 2005
- 2005
- English.
- In: International Semiconductor Device Research Symposium,2005.
- Conference paper (peer-reviewed)
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- NATURAL SCIENCES
- NATURVETENSKAP
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- kon (subject category)
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- Brillson, L.J.
- Tumakha, S.P.
- Gao, M.
- Ewing, D.J.
- Porter, L.M.
- Okojie, R.S.
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- Zhang, M.
- Pirouz, P.
- Wahab, Qamar Ul, ...
- Ma, X.
- Sudharshan, T.S.
- Onishi, T.
- Tsukimoto, S.
- Murakami, M.
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- Linköping University
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