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  • Khranovskyy, V.Institute for Problems of Material Science, Krzhyzhanovskyy Str. 3, 03630 Kyiv, Ukraine, Linkoping University, Department of Physics, Chemistry and Biology, SE-58183 Linkoping, Sweden (författare)

Improvement of ZnO thin film properties by application of ZnO buffer layers

  • Artikel/kapitelEngelska2007

Förlag, utgivningsår, omfång ...

  • Elsevier BV,2007
  • printrdacarrier

Nummerbeteckningar

  • LIBRIS-ID:oai:DiVA.org:liu-48355
  • https://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-48355URI
  • https://doi.org/10.1016/j.jcrysgro.2007.06.034DOI

Kompletterande språkuppgifter

  • Språk:engelska
  • Sammanfattning på:engelska

Ingår i deldatabas

Klassifikation

  • Ämneskategori:ref swepub-contenttype
  • Ämneskategori:art swepub-publicationtype

Anmärkningar

  • The effect of ZnO buffer layers prepared at different temperatures on the structural, optical and morphological properties of the ZnO main layer is reported. ZnO thin films (comprising a buffer and a main layer) were deposited on (0 0 0 1) c-sapphire substrates by PEMOCVD. Two-step growth regimes were applied to realize a homoepitaxial growth on ZnO buffers: low-temperature ZnO buffer layer deposited at Ts=300 °C and the main layer at Ts=500 °C, high-temperature ZnO buffer layer deposited at Ts=500 °C and the main layer at Ts=300 °C. For comparison, a sample grown at high-temperature Ts=500 °C by one-step procedure was used. The low-temperature buffer layer has shown the most beneficial effect on the structural and morphological properties, as expressed by the narrowing of the (0 0 2) diffraction peak (FWHM=0.07°) and crystallite size enlargement. However, the surface roughness of this sample is higher then that of the sample grown by one-step procedure and this needs further considerations. The photoluminescence results seem to support a conclusion that the application of a low-temperature buffer layer among the studied temperature regimes is the most advantageous. © 2007 Elsevier B.V. All rights reserved.

Ämnesord och genrebeteckningar

  • A1. ZnO PEMOCVD
  • B1. LT ZnO buffer layer
  • B2. Structural quality
  • NATURAL SCIENCES
  • NATURVETENSKAP

Biuppslag (personer, institutioner, konferenser, titlar ...)

  • Minikayev, R.Institute of Physics, P.A.S., Al. Lotników 32/46, 02-668 Warsaw, Poland (författare)
  • Trushkin, S.Institute of Physics, P.A.S., Al. Lotników 32/46, 02-668 Warsaw, Poland (författare)
  • Lashkarev, G.Institute for Problems of Material Science, Krzhyzhanovskyy Str. 3, 03630 Kyiv, Ukraine (författare)
  • Lazorenko, V.Institute for Problems of Material Science, Krzhyzhanovskyy Str. 3, 03630 Kyiv, Ukraine (författare)
  • Grossner, U.University of Oslo, Physics Department, Centre for Materials Science and Nanotechnology, N-0316 Oslo, Norway (författare)
  • Paszkowicz, W.Institute of Physics, P.A.S., Al. Lotników 32/46, 02-668 Warsaw, Poland (författare)
  • Suchocki, A.Institute of Physics, P.A.S., Al. Lotników 32/46, 02-668 Warsaw, Poland (författare)
  • Svensson, B.G.University of Oslo, Physics Department, Centre for Materials Science and Nanotechnology, N-0316 Oslo, Norway (författare)
  • Yakimova, RositsaLinköpings universitet,Halvledarmaterial,Tekniska högskolan(Swepub:liu)rosia15 (författare)
  • Institute for Problems of Material Science, Krzhyzhanovskyy Str. 3, 03630 Kyiv, Ukraine, Linkoping University, Department of Physics, Chemistry and Biology, SE-58183 Linkoping, SwedenInstitute of Physics, P.A.S., Al. Lotników 32/46, 02-668 Warsaw, Poland (creator_code:org_t)

Sammanhörande titlar

  • Ingår i:Journal of Crystal Growth: Elsevier BV308:1, s. 93-980022-02481873-5002

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