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Origin of photoresponse at 8-14 μm in stacks of self-assembled SiGe/Si quantum dots

Adnane, Bouchaib (author)
Linköpings universitet,Yt- och Halvledarfysik,Tekniska högskolan
Karlsson, Fredrik (author)
Linköpings universitet,Halvledarmaterial,Tekniska högskolan
Zhao, Ming (author)
Linköpings universitet,Yt- och Halvledarfysik,Tekniska högskolan
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Hansson, Göran (author)
Linköpings universitet,Yt- och Halvledarfysik,Tekniska högskolan
Holtz, Per-Olof, 1951- (author)
Linköpings universitet,Halvledarmaterial,Tekniska högskolan
Ni, Wei-Xin (author)
Linköpings universitet,Yt- och Halvledarfysik,Tekniska högskolan
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 (creator_code:org_t)
2009
2009
English.
In: Physical Review B. Condensed Matter and Materials Physics. - 1098-0121 .- 1550-235X.
  • Journal article (other academic/artistic)
Abstract Subject headings
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  • A normal incidence photodetector operating at 8-14 μm is demonstrated using p-type δ-doped SiGe dot multilayer structures grown by molecular beam epitaxy on Si(001) substrates. Based on the experimental results of photoluminescence and photoluminescence excitation spectroscopies together with numerical analysis, the origin of the measured photocurrent was attributed to intersubband optical transitions between the heavy hole and light hole states of the valence band of the self-assembled SiGe dots and subsequent lateral transport of photo-excited carriers in the conduction channels formed by Ge wetting layers.

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NATURAL SCIENCES
NATURVETENSKAP

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