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Determination of ca...
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Li, Z-FChinese Academy of Science, Shanghai
(author)
Determination of carrier-transfer length from side-wall quantum well to quantum wire by micro-photoluminescence scanning
- Article/chapterEnglish2003
Publisher, publication year, extent ...
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Springer Science Business Media,2003
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printrdacarrier
Numbers
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LIBRIS-ID:oai:DiVA.org:liu-59189
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https://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-59189URI
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https://doi.org/10.1007/s11664-003-0209-9DOI
Supplementary language notes
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Language:English
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Summary in:English
Part of subdatabase
Classification
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Subject category:ref swepub-contenttype
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Subject category:art swepub-publicationtype
Notes
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Micro-photoluminescence (mu-PL) line scanning across a single V-groove, GaAs/AlGaAs quantum wire (QWR) has been performed at room temperature, revealing a clear spatial-dependence of the PL. After fitting each PL spectrum by multi-Gaussian line shapes, intensity profiles of each PL component from confined structures have been obtained as functions of the scanning position. The PL quenching of a side-wall quantum well (SQWL) has been recognized in a certain area in the vicinity of the QWR and is interpreted by carrier transfer into the QWR within effective transfer length. By simulating the carrier-transfer process from SQWL to QWR as a convolution of a step function for carrier distribution and a Gaussian function for exciting laser irradiance, the effective transfer length of about 1.8+/-0.3 mum has, therefore, been concluded.
Subject headings and genre
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V-groove quantum wire; carrier-transfer length; micro-photoluminescence
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TECHNOLOGY
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TEKNIKVETENSKAP
Added entries (persons, corporate bodies, meetings, titles ...)
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Lu, WChinese Academy of Science, Shanghai
(author)
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Liu, X-QChinese Academy of Science, Shanghai
(author)
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Chen, X-SChinese Academy of Science, Shanghai
(author)
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Shen, S CChinese Academy of Science, Shanghai
(author)
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Fu, YChalmers
(author)
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Willander, MagnusChalmers(Swepub:liu)magwi72
(author)
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Tan, H HAustralian National University, Canberra
(author)
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Jagadish, CAustralian National University, Canberra
(author)
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Chinese Academy of Science, ShanghaiChalmers
(creator_code:org_t)
Related titles
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In:Journal of Electronic Materials: Springer Science Business Media32:8, s. 913-9160361-52351543-186X
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