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- Almqvist, NilsLuleå tekniska universitet,Materialvetenskap (author)
Roughness determination of plasma-modified surface layers with atomic force microscopy
- Article/chapterEnglish1995
Publisher, publication year, extent ...
- 1995
- printrdacarrier
Numbers
- LIBRIS-ID:oai:DiVA.org:ltu-13241
- https://urn.kb.se/resolve?urn=urn:nbn:se:ltu:diva-13241URI
- https://doi.org/10.1016/0040-6090(95)06933-XDOI
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- Language:English
- Summary in:English
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Notes
- Godkänd; 1995; Bibliografisk uppgift: 22nd International Conference on Metallurgical Coatings and Thin Films; 20070409 (ysko)
- Graphite surfaces exposed to the deuterium plasma in the TEXTOR tokamak were characterized in detail by means of scanning probe microscopy, ion beam analysis and colorimetry methods. The aim is to study the composition and structure of thin layer deposits formed on surfaces subjected to the tokamak plasma. The surface roughness was measured and parametrized in terms of fractal dimension and scaling constant. Several different methods for the fractal analysis of plasma-exposed surfaces have been critically evaluated. The main emphasis of this paper is on the correlation between surface roughness (fractal parameters), the amount of deposited atoms and the layer thickness.
Subject headings and genre
- NATURVETENSKAP Fysik Annan fysik hsv//swe
- NATURAL SCIENCES Physical Sciences Other Physics Topics hsv//eng
- Fysik
- Fysik
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- Rubel, M.Royal Institute of Technology, Physics Department-Frescati, Association EURATOM-NFR (author)
- Wienhold, P.Institute of Plasma Physics, Forschungszentrum Jülich, Association EURATOM-KFA (author)
- Fredriksson, Sverker (author)
- Luleå tekniska universitetMaterialvetenskap (creator_code:org_t)
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- In:Thin Solid Films270:1-2, s. 426-4300040-60901879-2731
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