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- Abadei, S.Department of Microelectronics, Chalmers University of Technology, Gothenburg, Sweden (author)
DC field dependent properties of Na0.5 K0.5 NbO3/SiO2/Si structures at millimeter-wave frequencies
- Article/chapterEnglish2001
Publisher, publication year, extent ...
- AIP Publishing,2001
- printrdacarrier
Numbers
- LIBRIS-ID:oai:DiVA.org:ltu-3894
- https://urn.kb.se/resolve?urn=urn:nbn:se:ltu:diva-3894URI
- https://doi.org/10.1063/1.1353838DOI
Supplementary language notes
- Language:English
- Summary in:English
Part of subdatabase
- SwePubSwePub
Classification
Notes
- Validerad; 2001; 20060917 (cira)
- Dielectric properties of laser-ablated 0.5-μm-thick c-axis epitaxial Na0.5K0.5NbO3 films on high-resistivity (7.7 Ω cm) silicon SiO2/Si substrate are studied experimentally at frequencies up to 40 GHz. For measurements, planar 0.5-μm-thick gold electrodes (interdigital and straight slot) are photolithography defined on the top surface of Na0.5K0.5NbO3 films. The slot width between the electrodes is 2 or 4 μm. 13% capacitance change at 40 V dc bias and Q factor more than 15 are observed at 40 GHz, which makes the structure useful for applications in electrically tunable millimeter-wave devices
Subject headings and genre
- TEKNIK OCH TEKNOLOGIER Materialteknik Annan materialteknik hsv//swe
- ENGINEERING AND TECHNOLOGY Materials Engineering Other Materials Engineering hsv//eng
- Engineering Materials
- Materialteknik
Added entries (persons, corporate bodies, meetings, titles ...)
- Gevorgian, SDepartment of Microelectronics, Chalmers University of Technology, Gothenburg, Sweden;Core Unit Research Center, Ericsson Microwave Systems, Mölndal, Sweden (author)
- Cho, C.-RDepartment of Condensed Matter Physics, Royal Institute of Technology, Stockholm, Sweden (author)
- Grishin, A.Department of Condensed Matter Physics, Royal Institute of Technology, Stockholm, Sweden (author)
- Andreasson, JohannaLuleå tekniska universitet (author)
- Lindbäck, TureLuleå tekniska universitet(Swepub:ltu)ture (author)
- Department of Microelectronics, Chalmers University of Technology, Gothenburg, SwedenDepartment of Microelectronics, Chalmers University of Technology, Gothenburg, Sweden;Core Unit Research Center, Ericsson Microwave Systems, Mölndal, Sweden (creator_code:org_t)
Related titles
- In:Applied Physics Letters: AIP Publishing78:13, s. 1900-19020003-69511077-3118
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