Monte Carlo simulation of multi-band carrier transport in semiconductor materials with complex unit cells

• In a traditional Monte Carlo (MC) model the carrier preserves its band identity during the free flight between scatterings. However, this assumption may not be valid in semiconductor materials with complex unit cell. A new model is needed where the traditional way to use classical equations during the free flight between scattering is replaced by a fully quantum mechanical model of the Bloch carrier dynamics between scattering events. In this work we present such a model along with simulated results of the hole initiated impact ionization coefficients of 4H-SiC

Ämnesord

TEKNIK OCH TEKNOLOGIER  -- Elektroteknik och elektronik (hsv//swe)

ENGINEERING AND TECHNOLOGY  -- Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)

Nyckelord

4H-SiC

Monte Carlo

impact ionization

Electrical engineering, electronics and photonics

Elektroteknik, elektronik och fotonik

Publikations- och innehållstyp

vet (ämneskategori)

kon (ämneskategori)