Sample Preparation Using Argon Ion Beam Milling

• Surface and cross section analysis can provide important information on material properties. It has, however, been difficult to characterise the internal structure at a micro scale using cross sections prepared with conventional methods, such as e.g. mechanical grinding and polishing, because these procedures can damage the surface and introduce artefacts. A few years ago, a new precision argon ion beam cross section polisher was shown to be a suitable sample preparation technique for microstructure characterisation. It produces high quality cross sections free from artefacts and distortions. This technique can be used for cross section preparation of a wide variety of materials including composites, metals, ceramics and polymers. Argon ion beam milling can also be used in combination with focused ion beam (FIB) as a final step to remove FIB-damaged layers before nano- and microstructure characterisation in high resolution transmission electron microscopy (HRTEM).

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NATURVETENSKAP  -- Kemi (hsv//swe)

NATURAL SCIENCES  -- Chemical Sciences (hsv//eng)

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