A Monte Carlo Study of low field transport in Al doped 4H-SiC

Martinez, ADepartment of Microelectronics and Information Technology, Royal Institute of Technology (KTH), Electrum 229, SE-16440 Stockholm (författare)

The paper was also presented at the following conference: Spring Meeting of the European-Materials-Research-Society STRASBOURG, FRANCE, JUN 05-08, 2001 European Mat Res Soc
The ohmic transport of holes in p-type aluminum-doped 4H-SiC samples is investigated using a Monte Carlo (MC) tool based on a full-potential band structure. The temperature and doping dependence of the hole mobility and its anisotropy are calculated and discussed from a physical point of view, where we stress the importance of considering two-band conduction. Acoustic and optical phonon scattering, as well as ionized and neutral impurity scattering, have been considered. The MC program considers incomplete ionization of impurity atoms, and we assume an impurity level with the ionization energy 0.2 eV, corresponding to Al-doped samples. © 2001 Published by Elsevier Science B.V

Hjelm, MatsMittuniversitetet,Institutionen för informationsteknologi och medier (-2013)(Swepub:miun)mathje (författare)
Lindefelt, UlfDepartment of Microelectronics and Information Technology, Royal Institute of Technology (KTH), Electrum 229, SE-16440 Stockholm(Swepub:miun)ullind (författare)
Nilsson, Hans-ErikMittuniversitetet,Institutionen för informationsteknologi och medier (-2013)(Swepub:miun)hannil (författare)
Department of Microelectronics and Information Technology, Royal Institute of Technology (KTH), Electrum 229, SE-16440 StockholmInstitutionen för informationsteknologi och medier (-2013) (creator_code:org_t)

Av författaren/redakt...: Martinez, A; Hjelm, Mats; Lindefelt, Ulf; Nilsson, Hans-Er ...

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