Applicability of characterization techniques on fine scale surfaces

• In this study, several surface topographies typical for dental implants were evaluated by different measurement techniques. The samples were prepared by machine turning, wet chemical etching and electrochemical polishing of titanium discs. The measurement techniques included an atomic force microscope (AFM), coherence scanning interferometer (CSI) and a 3D stereo scanning electron microscope (SEM). The aim was to demonstrate and discuss similarities and differences in the results provided by these techniques when analyzing submicron surface topographies. The estimated surface roughness parameters were not directly comparable since the techniques had different surface spatial wavelength band limits. However, the comparison was made possible by applying a 2D power spectral density (PSD) function. Furthermore, to simplify the comparison, all measurements were characterized using the ISO 25178 standard parameters. Additionally, a Fourier transform was applied to calculate the instrument transfer function in order to investigate the behavior of CSI at different wavelength ranges. The study showed that 3D stereo SEM results agreed well with AFM measurements for the studied surfaces. Analyzed surface parameter values were in general higher when measured by CSI in comparison to both AFM and 3D stereo SEM results. In addition, the PSD analysis showed a higher power spectrum density in the lower frequency range 10-2-10-1 μm-1 for the CSI compared with the other techniques.

Ämnesord

TEKNIK OCH TEKNOLOGIER  -- Materialteknik -- Bearbetnings-, yt- och fogningsteknik (hsv//swe)

ENGINEERING AND TECHNOLOGY  -- Materials Engineering -- Manufacturing, Surface and Joining Technology (hsv//eng)

Nyckelord

3D-stereo SEM

AFM

Coherence scanning interferometer

power spectral density

surface topography

transfer function

Atomic force microscopy

Chemical polishing

Dental prostheses

Interferometers

Scanning

Scanning electron microscopy

Spectral density

Surface roughness

Topography

Transfer functions

Wet etching

3d stereos

Characterization techniques

Measurement techniques

Power spectrum density

Scanning interferometers

Spatial wavelengths

Surface roughness parameters

Wavelength ranges

Parameter estimation

Publikations- och innehållstyp

ref (ämneskategori)

art (ämneskategori)