Sökning: WFRF:(Araújo João) >
Characterizing comp...
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Araujo, JeffersonPontifical Catholic University of Rio de Janeiro, Brazil
(författare)
Characterizing complex mineral structures in thin sections of geological samples with a scanning hall effect microscope
- Artikel/kapitelEngelska2019
Förlag, utgivningsår, omfång ...
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2019-04-05
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MDPI AG,2019
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printrdacarrier
Nummerbeteckningar
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LIBRIS-ID:oai:DiVA.org:ri-39518
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https://urn.kb.se/resolve?urn=urn:nbn:se:ri:diva-39518URI
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https://doi.org/10.3390/s19071636DOI
Kompletterande språkuppgifter
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Språk:engelska
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Sammanfattning på:engelska
Ingår i deldatabas
Klassifikation
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Ämneskategori:ref swepub-contenttype
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Ämneskategori:art swepub-publicationtype
Anmärkningar
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Funding details: Conselho Nacional de Desenvolvimento Científico e Tecnológico; Funding details: Fundação Carlos Chagas Filho de Amparo à Pesquisa do Estado do Rio de Janeiro; Funding details: Coordenação de Aperfeiçoamento de Pessoal de Nível Superior; Funding text 1: Funding: This study was funded in part by the following Brazilian agencies: The National Council for Scientific and Technological Development (Conselho Nacional de Desenvolvimento Científico e Tecnológico—CNPq), the Coordinating Agency for the Improvement of Higher Education (Coordenação de Aperfeicoamento de Pessoal de Nível Superior—Capes) and the Research Support Foundation of Rio de Janeiro (Fundação de Amparo à Pesquisa do Estado do Rio de Janeiro—FAPERJ).
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We improved a magnetic scanning microscope for measuring the magnetic properties of minerals in thin sections of geological samples at submillimeter scales. The microscope is comprised of a 200 µm diameter Hall sensor that is located at a distance of 142 µm from the sample; an electromagnet capable of applying up to 500 mT DC magnetic fields to the sample over a 40 mm diameter region; a second Hall sensor arranged in a gradiometric configuration to cancel the background signal applied by the electromagnet and reduce the overall noise in the system; a custom-designed electronics system to bias the sensors and allow adjustments to the background signal cancelation; and a scanning XY stage with micrometer resolution. Our system achieves a spatial resolution of 200 µm with a noise at 6.0 Hz of 300 nT rms /(Hz) 1/2 in an unshielded environment. The magnetic moment sensitivity is 1.3 × 10 −11 Am 2 . We successfully measured the representative magnetization of a geological sample using an alternative model that takes the sample geometry into account and identified different micrometric characteristics in the sample slice.
Ämnesord och genrebeteckningar
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Geological sample
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Hall sensor
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Magnetic materials
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Magnetic scanning microscope
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Electromagnets
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Geology
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Hall effect transducers
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Magnetic moments
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Scanning
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Background signals
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DC magnetic field
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Electronics system
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Geological samples
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Spatial resolution
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Unshielded environment
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Microscopes
Biuppslag (personer, institutioner, konferenser, titlar ...)
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Reis, AndreObservatório Nacional, Brazil
(författare)
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Oliveira, VanderleiObservatório Nacional, Brazil
(författare)
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Santos, AmandaUniversity of California, US
(författare)
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Luz-Lima, CleaneoUniversidade Federal do Piauí, Brazil
(författare)
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Yokoyama, ElderUniversity of Brasília, Brazil
(författare)
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Mendoza, LeonardoUniversidade Estadual do Rio de Janeiro, Brazil
(författare)
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Pereira, JoaoRISE,Acreo(Swepub:ri)joaope@ri.se
(författare)
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Bruno, AntonioPontifical Catholic University of Rio de Janeiro, Brazil
(författare)
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Pontifical Catholic University of Rio de Janeiro, BrazilObservatório Nacional, Brazil
(creator_code:org_t)
Sammanhörande titlar
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Ingår i:Sensors: MDPI AG19:71424-8220
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