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  • Fröjdh, Christer,1952-Mittuniversitetet,Avdelningen för elektronikkonstruktion,STC (author)

Precision scan-imaging for paperboard quality inspection utilizing X-ray fluorescence

  • Article/chapterEnglish2018

Publisher, publication year, extent ...

  • Institute of Physics Publishing,2018
  • printrdacarrier

Numbers

  • LIBRIS-ID:oai:DiVA.org:ri-42470
  • https://urn.kb.se/resolve?urn=urn:nbn:se:ri:diva-42470URI
  • https://doi.org/10.1088/1748-0221/13/01/C01021DOI
  • https://urn.kb.se/resolve?urn=urn:nbn:se:miun:diva-32724URI
  • https://urn.kb.se/resolve?urn=urn:nbn:se:hig:diva-37232URI

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  • Language:English
  • Summary in:English

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  • Subject category:ref swepub-contenttype
  • Subject category:art swepub-publicationtype

Notes

  • Funding text 1: This work was funded by the Swedish KK-foundation. Johan Lindgren at Iggesunds Holmen Group provided the paperboard samples and necessary information for this work.
  • Paperboard is typically made up of a core of cellulose fibers [C6H10O5] and a coating layer of [CaCO3]. The uniformity of these layers is a critical parameter for the printing quality. Current quality control methods include chemistry based visual inspection methods as well as X-ray based methods to measure the coating thickness. In this work we combine the X-ray fluorescence signals from the Ca atoms (3.7 keV) in the coating and from a Cu target (8.0 keV) placed behind the paper to simultaneously measure both the coating and the fibers. Cu was selected as the target material since its fluorescence signal is well separated from the Ca signal while its fluorescence's still are absorbed sufficiently in the paper. A laboratory scale setup is built using stepper motors, a silicon drift detector based spectrometer and a collimated X-ray beam. The spectroscopic image is retrieved by scanning the paperboard surface and registering the fluorescence signals from Ca and Cu. The exposure time for this type of setups can be significantly improved by implementing spectroscopic imaging sensors. The material contents in the layers can then be retrieved from the absolute and relative intensities of these two signals.

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  • Norlin, Börje,1967-Mittuniversitetet,Avdelningen för elektronikkonstruktion,STC(Swepub:miun)bornor (author)
  • Reza, Salim,1985-Mittuniversitetet,Avdelningen för elektronikkonstruktion,STC,Mittuniversitet(Swepub:hig)samrea (author)
  • Nordin, T.RISE,MoRe Research Örnsköldsvik AB,Process Technology Department, MoRe Research, Örnsköldsvik (author)
  • MittuniversitetetAvdelningen för elektronikkonstruktion (creator_code:org_t)

Related titles

  • In:Journal of Instrumentation: Institute of Physics Publishing13:11748-0221

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