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  • Tsatrafyllis, N. (author)

The ion microscope as a tool for imaging the ion distribution produced by linear and non-linear processes at the focus of an XUV beam

  • Article/chapterEnglish2017

Publisher, publication year, extent ...

  • IEEE,2017
  • printrdacarrier

Numbers

  • LIBRIS-ID:oai:DiVA.org:umu-152159
  • https://urn.kb.se/resolve?urn=urn:nbn:se:umu:diva-152159URI
  • https://doi.org/10.1109/CLEOE-EQEC.2017.8086809DOI

Supplementary language notes

  • Language:English
  • Summary in:English

Part of subdatabase

Classification

  • Subject category:ref swepub-contenttype
  • Subject category:kon swepub-publicationtype

Notes

  • Also published in series Optics InfoBase Conference papers, ISSN 21622701,
  • Summary form only given. We demonstrate a tool for quantitative measurements in the linear and non-linear extreme ultraviolet (XUV) spectral region measuring spatially resolved atomic ionization products at the focus of an XUV beam [1, 2]. The ionizing radiation is a comb of the 11th-15th harmonics of a Ti:Sapphire femtosecond laser beam produced in a Xenon gas jet. The spatial ion distribution at the focus of the harmonics is recorded using an ion microscope detector [2, 3]. Spatially resolved single- and two-photon ionization products of Argon and Helium are observed. From such ion distributions single- and two-photon generalized cross sections have be extracted by a self-calibrating method. This is the first observation of spatially resolved two-XUV-photon ionization at the focus of the XUV radiation which constitutes an important step towards future single-shot temporal characterization of attosecond (asec) pulses [4].

Subject headings and genre

Added entries (persons, corporate bodies, meetings, titles ...)

  • Bergues, B. (author)
  • Schroeder, H. (author)
  • Veisz, LaszloUmeå universitet,Institutionen för fysik,Max-Planck-Institut fur Quantenoptik, D-85748 Garching, Germany(Swepub:umu)vela0020 (author)
  • Skantzakis, E. (author)
  • Gray, D. (author)
  • Bodi, B. (author)
  • Kuhn, S. (author)
  • Tsakiris, G. D. (author)
  • Charalambidis, D. (author)
  • Tzallas, P. (author)
  • Umeå universitetInstitutionen för fysik (creator_code:org_t)

Related titles

  • In:2017 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC): IEEE9781509067367

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