Dual-trap technique for reduction of low-frequency noise in force measuring optical tweezers

High-resolution long-time force measurements by optical tweezers are often limited by low- frequency (1/f) noise. A dual-trap technique is presented that can reduce such noise in the force signal. It incorporates a second trap (a reference trap) that probes the noise in the system and it is based upon the assumption that the low-frequency parts of the noise from the two traps are correlated. A subtraction of the low-frequency signal from the reference trap from the signal from the force measuring trap will therefore yield a net signal that is significantly less influenced by noise. It is shown that this dual-trap technique can reduce the noise in the force signal up to 60% depending on detection bandwidth.

Andersson, MagnusUmeå universitet,Institutionen för fysik(Swepub:umu)musann96 (författare)
Axner, OveUmeå universitet,Institutionen för fysik(Swepub:umu)ovax0001 (författare)
Fällman, ErikUmeå universitet,Institutionen för fysik(Swepub:umu)erfa0002 (författare)
Umeå universitetInstitutionen för fysik (creator_code:org_t)

Av författaren/redakt...: Klein, Markus; Andersson, Magnu ...; Axner, Ove; Fällman, Erik

Kungliga biblioteket hanterar dina personuppgifter i enlighet med EU:s dataskyddsförordning (2018), GDPR. Läs mer om hur det funkar här.
Så här hanterar KB dina uppgifter vid användning av denna tjänst.