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Focused ion beam fa...
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Surpi, AlessandroUppsala universitet,Institutionen för fysik och materialvetenskap
(author)
Focused ion beam fabrication procedures of x-ray micro Fresnel zone plates
- Article/chapterEnglish2007
Publisher, publication year, extent ...
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2007-02-20
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IOP Publishing,2007
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printrdacarrier
Numbers
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LIBRIS-ID:oai:DiVA.org:uu-10709
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https://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-10709URI
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https://doi.org/10.1088/0960-1317/17/3/026DOI
Supplementary language notes
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Language:English
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Summary in:English
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Subject category:ref swepub-contenttype
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Subject category:art swepub-publicationtype
Notes
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In this paper the use of focused ion beam (FIB) mask-less lithography is presented as a novel and simple way to fabricate x-ray Fresnel zone plates (FZPs), and a prototype of a FIB-made 100 nm resolution FZP with 38 zones is described. Considerations for future developments—the maximum aspect ratio achievable by FIB lithography in nickel, a way to produce zones with a parabolic transverse profile, as theoretically required for the highest efficiency in focusing—are also reported.
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Added entries (persons, corporate bodies, meetings, titles ...)
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Valizadeh, SimaUppsala universitet,Tillämpad materialvetenskap(Swepub:uu)sival102
(author)
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Leifer, KlausUppsala universitet,Tillämpad materialvetenskap(Swepub:uu)kllei839
(author)
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Lagomarsino, StefanoIstituto di Fotonica e Nanotecnologie (CNR) Via Cineto Romano 42, 00156 Roma, Italy
(author)
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Uppsala universitetInstitutionen för fysik och materialvetenskap
(creator_code:org_t)
Related titles
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In:Journal of Micromechanics and Microengineering: IOP Publishing17:3, s. 617-6220960-13171361-6439
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