System-on-Chip test scheduling with defect-probability and temperature considerations

↓ Direkt till sidans innehåll
↓ Direkt till sidans sekundära innehåll (sidomenyn)

Search: WFRF:(Van Duijn Cornelia M.) > (2009) > System-on-Chip test...

Details
MARC

He, Zhiyuan,1976-Linköpings universitet,ESLAB - Laboratoriet för inbyggda system,Tekniska högskolan (author)

System-on-Chip test scheduling with defect-probability and temperature considerations

BookEnglish2007

Publisher, publication year, extent ...

Linköping :Linköpings universitet,2007
111 s.
electronicrdacarrier

Numbers

LIBRIS-ID:oai:DiVA.org:liu-38257
ISBN:9789185831814
https://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-38257URI

Supplementary language notes

Language:English
Summary in:English

Part of subdatabase

SwePubSwePub

Classification

Subject category:vet swepub-contenttype
Subject category:lic swepub-publicationtype

Series

Linköping Studies in Information Science. Dissertation,1403-6231 ;1313

Notes

2007
Electronic systems have become highly complex, which results in a dramatic increase of both design and production cost. Recently a core-based system-on-chip (SoC) design methodology has been employed in order to reduce these costs. However, testing of SoCs has been facing challenges such as long test application time and high temperature during test. In this thesis, we address the problem of minimizing test application time for SoCs and propose three techniques to generate efficient test schedules.First, a defect-probability driven test scheduling technique is presented for production test, in which an abort-on-first-fail (AOFF) test approach is employed and a hybrid built-in self-test architecture is assumed. Using an AOFF test approach, the test process can be aborted as soon as the first fault is detected. Given the defect probabilities of individual cores, a method is proposed to calculate the expected test application time (ETAT). A heuristic is then proposed to generate test schedules with minimized ETATs.Second, a power-constrained test scheduling approach using test set partitioning is proposed. It assumes that, during the test, the total amount of power consumed by the cores being tested in parallel has to be lower than a given limit. A heuristic is proposed to minimize the test application time, in which a test set partitioning technique is employed to generate more efficient test schedules.Third, a thermal-aware test scheduling approach is presented, in which test set partitioning and interleaving are employed. A constraint logic programming (CLP) approach is deployed to find the optimal solution. Moreover, a heuristic is also developed to generate near-optimal test schedules especially for large designs to which the CLP-based algorithm is inapplicable.Experiments based on benchmark designs have been carried out to demonstrate the applicability and efficiency of the proposed techniques.

Subject headings and genre

NATURVETENSKAP Data- och informationsvetenskap Datavetenskap hsv//swe
NATURAL SCIENCES Computer and Information Sciences Computer Sciences hsv//eng
Computer science
Datavetenskap

Added entries (persons, corporate bodies, meetings, titles ...)

Eles, Petru,ProfessorLinköpings universitet,ESLAB - Laboratoriet för inbyggda system,Tekniska högskolan(Swepub:liu)petel71 (thesis advisor)
Peng, Zebo,ProfessorLinköpings universitet,ESLAB - Laboratoriet för inbyggda system,Tekniska högskolan(Swepub:liu)zebpe83 (thesis advisor)
Linköpings universitetESLAB - Laboratoriet för inbyggda system (creator_code:org_t)

Internet link

Find in a library

System-on-Chip test scheduling with defect-probability and temperature considera... (Search the publication in LIBRIS)

To the university's database

Find more in SwePub

By the author/editor: He, Zhiyuan, 197 ...; Eles, Petru, Pro ...; Peng, Zebo, Prof ...

About the subject

NATURAL SCIENCES: NATURAL SCIENCES; and Computer and Inf ...; and Computer Science ...

Parts in the series: Linköping Studie ...

By the university: Linköping University

Search outside SwePub

Extend your search to:: Google; Google Book Search; Google Scholar

Kungliga biblioteket hanterar dina personuppgifter i enlighet med EU:s dataskyddsförordning (2018), GDPR. Läs mer om hur det funkar här.
Så här hanterar KB dina uppgifter vid användning av denna tjänst.

LIBRIS.kb.se