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Method for more acc...
Method for more accurate transmittance measurements of low-angle scattering samples using an integrating sphere with an entry port beam diffuser
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- Nilsson, Annica M (författare)
- Uppsala universitet,Fasta tillståndets fysik
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- Jonsson, Andreas (författare)
- Uppsala universitet,Fasta tillståndets fysik
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- Jonsson, Jacob C (författare)
- Environmental Energy Technology Division, Lawrence Berkeley National Laboratory, Berkeley, CA, USA
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- Roos, Arne (författare)
- Uppsala universitet,Fasta tillståndets fysik
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(creator_code:org_t)
- 2011
- 2011
- Engelska.
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Ingår i: Applied Optics. - 1559-128X .- 2155-3165. ; 50:7, s. 999-1006
- Relaterad länk:
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https://urn.kb.se/re...
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https://doi.org/10.1...
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Abstract
Ämnesord
Stäng
- For most integrating sphere measurements, the difference in light distribution between a specular reference beam and a diffused sample beam can result in significant errors. The problem becomes especially pronounced in integrating spheres that include a port for reflectance or diffuse transmittance measurements. The port is included in many standard spectrophotometers to facilitate a multipurpose instrument, however, absorption around the port edge can result in a detected signal that is too low. The absorption effect is especially apparent for low-angle scattering samples, because a significant portion of the light is scattered directly onto that edge. In this paper, a method for more accurate transmittance measurements of low-angle light-scattering samples is presented. The method uses a standard integrating sphere spectrophotometer, and the problem with increased absorption around the port edge is addressed by introducing a diffuser between the sample and the integrating sphere during both reference and sample scan. This reduces the discrepancy between the two scans and spreads the scattered light over a greater portion of the sphere wall. The problem with multiple reflections between the sample and diffuser is successfully addressed using a correction factor. The method is tested for two patterned glass samples with low-angle scattering and in both cases the transmittance accuracy is significantly improved.
Nyckelord
- TECHNOLOGY
- TEKNIKVETENSKAP
- Teknisk fysik med inriktning mot fasta tillståndets fysik
- Engineering Science with specialization in Solid State Physics
Publikations- och innehållstyp
- ref (ämneskategori)
- art (ämneskategori)
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