SwePub
Sök i LIBRIS databas

  Utökad sökning

WFRF:(Jonsson Jacob)
 

Sökning: WFRF:(Jonsson Jacob) > Method for more acc...

Method for more accurate transmittance measurements of low-angle scattering samples using an integrating sphere with an entry port beam diffuser

Nilsson, Annica M (författare)
Uppsala universitet,Fasta tillståndets fysik
Jonsson, Andreas (författare)
Uppsala universitet,Fasta tillståndets fysik
Jonsson, Jacob C (författare)
Environmental Energy Technology Division, Lawrence Berkeley National Laboratory, Berkeley, CA, USA
visa fler...
Roos, Arne (författare)
Uppsala universitet,Fasta tillståndets fysik
visa färre...
 (creator_code:org_t)
2011
2011
Engelska.
Ingår i: Applied Optics. - 1559-128X .- 2155-3165. ; 50:7, s. 999-1006
  • Tidskriftsartikel (refereegranskat)
Abstract Ämnesord
Stäng  
  • For most integrating sphere measurements, the difference in light distribution between a specular reference beam and a diffused sample beam can result in significant errors. The problem becomes especially pronounced in integrating spheres that include a port for reflectance or diffuse transmittance measurements. The port is included in many standard spectrophotometers to facilitate a multipurpose instrument, however, absorption around the port edge can result in a detected signal that is too low. The absorption effect is especially apparent for low-angle scattering samples, because a significant portion of the light is scattered directly onto that edge. In this paper, a method for more accurate transmittance measurements of low-angle light-scattering samples is presented. The method uses a standard integrating sphere spectrophotometer, and the problem with increased absorption around the port edge is addressed by introducing a diffuser between the sample and the integrating sphere during both reference and sample scan. This reduces the discrepancy between the two scans and spreads the scattered light over a greater portion of the sphere wall. The problem with multiple reflections between the sample and diffuser is successfully addressed using a correction factor. The method is tested for two patterned glass samples with low-angle scattering and in both cases the transmittance accuracy is significantly improved.

Nyckelord

TECHNOLOGY
TEKNIKVETENSKAP
Teknisk fysik med inriktning mot fasta tillståndets fysik
Engineering Science with specialization in Solid State Physics

Publikations- och innehållstyp

ref (ämneskategori)
art (ämneskategori)

Hitta via bibliotek

Till lärosätets databas

Sök utanför SwePub

Kungliga biblioteket hanterar dina personuppgifter i enlighet med EU:s dataskyddsförordning (2018), GDPR. Läs mer om hur det funkar här.
Så här hanterar KB dina uppgifter vid användning av denna tjänst.

 
pil uppåt Stäng

Kopiera och spara länken för att återkomma till aktuell vy