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Piezoresistive and self-actuated 128-cantilever arrays for nanotechnology applications

Rangelow, I. W. (author)
Ivanov, Tzv. (author)
Ivanova, K. (author)
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Volland, B. E. (author)
Grabiec, P. (author)
Sarov, Y. (author)
Persaud, A. (author)
Gotszalk, T. (author)
Zawierucha, P. (author)
Zielony, M. (author)
Dontzov, D. (author)
Schmidt, B. (author)
Zier, M. (author)
Nikolov, N. (author)
Kostic, I. (author)
Engl, W. (author)
Sulzbach, T. (author)
Mielczarski, J. (author)
Kolb, S. (author)
Latimier, Du P. (author)
Pedreau, R. (author)
Djakov, V. (author)
Huq, S. E. (author)
Edinger, K. (author)
Fortagne, O. (author)
Almansa, A. (author)
Blom, Hans-Olof (author)
Uppsala universitet,Fasta tillståndets elektronik
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 (creator_code:org_t)
Elsevier BV, 2007
2007
English.
In: Microelectronic Engineering. - : Elsevier BV. - 0167-9317 .- 1873-5568. ; 84:5-8, s. 1260-1264
  • Journal article (peer-reviewed)
Abstract Subject headings
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  • A major limitation for future nanotechnology, particularly for bottom-up manufacturing is the non-availability of 2-dimensional massively parallel probe arrays. Scanning proximity probes are uniquely powerful tools for analysis, manipulation and bottom-up synthesis: they are capable of addressing and engineering surfaces at the atomic level and are the key to unlocking the full potential of Nanotechnology. Generic massively parallel intelligent cantilever-probe platforms is demonstrated through a number of existing and ground-breaking techniques. A packaged VLSI NEMS-chip (Very Large Scale Integrated Nano Electro Mechanical System) incorporating 128 proximal probes, fully addressable with control and readout interconnects and advanced software will be presented.

Keyword

piezoresistive micro-cantilever
self-actuated micro-cantilever
cantilever arrays
TECHNOLOGY
TEKNIKVETENSKAP

Publication and Content Type

ref (subject category)
art (subject category)

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