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- Blom, TobiasUppsala universitet,Experimentell fysik,Electron Microscopy and Nanoenginnering (author)
In-situ electrical characterization during defect insertion in exfoliated graphene sheets with a focused gallium ion beam at room and cryogenic temperatures
- BookEnglish
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- LIBRIS-ID:oai:DiVA.org:uu-160615
- https://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-160615URI
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- Language:English
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- TEKNIK OCH TEKNOLOGIER Nanoteknik hsv//swe
- ENGINEERING AND TECHNOLOGY Nano-technology hsv//eng
- TEKNIK OCH TEKNOLOGIER Elektroteknik och elektronik Annan elektroteknik och elektronik hsv//swe
- ENGINEERING AND TECHNOLOGY Electrical Engineering, Electronic Engineering, Information Engineering Other Electrical Engineering, Electronic Engineering, Information Engineering hsv//eng
- Focused Ion beam
- Graphene
- defects
- conductivity
- cryogenic temperatures
- Teknisk fysik med inriktning mot materialanalys
- Engineering Science with specialization in Materials Analysis
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- Jafri, S.H. MUppsala universitet,Experimentell fysik,Electron Microscopy and Nanoenginnering(Swepub:uu)hasja537 (author)
- di Cristo, V.Uppsala universitet,Tillämpad materialvetenskap,Electron Microscopy and Nanoenginnering (author)
- Leifer, KlausUppsala universitet,Experimentell fysik,Electron Microscopy and Nanoenginnering (author)
- Uppsala universitetExperimentell fysik (creator_code:org_t)
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