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Profiling structure...
Profiling structured beams using injected aerosols
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Duane Loh, N. (author)
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Starodub, D. (author)
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Lomb, L. (author)
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Hampton, C. Y. (author)
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Martin, A. V. (author)
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Sierra, R. G. (author)
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Barty, A. (author)
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Aquila, A. (author)
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Schulz, J. (author)
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Steinbrener, J. (author)
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Shoeman, R. L. (author)
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Kassemeyer, S. (author)
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Bostedt, C. (author)
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Bozek, J. (author)
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Epp, S. W. (author)
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Erk, B. (author)
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Hartmann, R. (author)
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Rolles, D. (author)
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Rudenko, A. (author)
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Rudek, B. (author)
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Foucar, L. (author)
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Kimmel, N. (author)
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Weidenspointner, G. (author)
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Hauser, G. (author)
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Holl, P. (author)
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Pedersoli, E. (author)
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Liang, M. (author)
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Hunter, M. S. (author)
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Gumprecht, L. (author)
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Coppola, N. (author)
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Wunderer, C. (author)
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Graafsma, H. (author)
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Maia, F. R. N. C. (author)
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Ekeberg, T. (author)
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- Hantke, Max Felix (author)
- Uppsala universitet,Molekylär biofysik
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Fleckenstein, H. (author)
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Hirsemann, H. (author)
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Nass, K. (author)
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White, T. A. (author)
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Tobias, H. J. (author)
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Farquar, G. R. (author)
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Henry Benner, W. (author)
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Hau-Riege, S. (author)
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Reich, C. (author)
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Hartmann, A. (author)
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Soltau, H. (author)
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Marchesini, S. (author)
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Bajt, S. (author)
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Barthelmess, M. (author)
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Strueder, L. (author)
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Ullrich, J. (author)
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Bucksbaum, P. (author)
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Hodgson, K. O. (author)
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Frank, M. (author)
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Schlichting, I. (author)
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Chapman, H. N. (author)
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Bogan, M. J. (author)
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(creator_code:org_t)
- SPIE, 2012
- 2012
- English.
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In: Proceedings of SPIE. - : SPIE. - 9780819492210 ; , s. 850403-
- Related links:
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https://pure.mpg.de/...
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https://urn.kb.se/re...
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https://doi.org/10.1...
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Abstract
Subject headings
Close
- Profiling structured beams produced by X-ray free-electron lasers (FELs) is crucial to both maximizing signal intensity for weakly scattering targets and interpreting their scattering patterns. Earlier ablative imprint studies describe how to infer the X-ray beam profile from the damage that an attenuated beam inflicts on a substrate. However, the beams in-situ profile is not directly accessible with imprint studies because the damage profile could be different from the actual beam profile. On the other hand, although a Shack-Hartmann sensor is capable of in-situ profiling, its lenses may be quickly damaged at the intense focus of hard X-ray FEL beams. We describe a new approach that probes the in-situ morphology of the intense FEL focus. By studying the translations in diffraction patterns from an ensemble of randomly injected sub-micron latex spheres, we were able to determine the non-Gaussian nature of the intense FEL beam at the Linac Coherent Light Source (SLAC National Laboratory) near the FEL focus. We discuss an experimental application of such a beam-profiling technique, and the limitations we need to overcome before it can be widely applied.
Keyword
- Aerosols
- Beam diagnostics
- Beam profiling
- Diffraction
- Hartmann sensor
- Imaging
- LCLS
- X-ray freeelectron laser
Publication and Content Type
- ref (subject category)
- kon (subject category)
Find in a library
To the university's database
- By the author/editor
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Duane Loh, N.
-
Starodub, D.
-
Lomb, L.
-
Hampton, C. Y.
-
Martin, A. V.
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Sierra, R. G.
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show more...
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Barty, A.
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Aquila, A.
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Schulz, J.
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Steinbrener, J.
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Shoeman, R. L.
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Kassemeyer, S.
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Bostedt, C.
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Bozek, J.
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Epp, S. W.
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Erk, B.
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Hartmann, R.
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Rolles, D.
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Rudenko, A.
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Rudek, B.
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Foucar, L.
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Kimmel, N.
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Weidenspointner, ...
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Hauser, G.
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Holl, P.
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Pedersoli, E.
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Liang, M.
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Hunter, M. S.
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Gumprecht, L.
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Coppola, N.
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Wunderer, C.
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Graafsma, H.
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Maia, F. R. N. C ...
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Ekeberg, T.
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Hantke, Max Feli ...
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Fleckenstein, H.
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Hirsemann, H.
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Nass, K.
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White, T. A.
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Tobias, H. J.
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Farquar, G. R.
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Henry Benner, W.
-
Hau-Riege, S.
-
Reich, C.
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Hartmann, A.
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Soltau, H.
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Marchesini, S.
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Bajt, S.
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Barthelmess, M.
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Strueder, L.
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Ullrich, J.
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Bucksbaum, P.
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Hodgson, K. O.
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Frank, M.
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Schlichting, I.
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Chapman, H. N.
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Bogan, M. J.
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show less...
- Articles in the publication
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Proceedings of S ...
- By the university
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Uppsala University