WFRF:(Jo M)
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Influence of silicon-sapphire interface defects on SOS MESFET beavior
- Nylander, JO (author)
- Magnusson, U (author)
- Rosling, M (author)
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- (creator_code:org_t)
- 1988
- 1988
- English.
- In: Solid-State Electronics. - 0038-1101 .- 1879-2405. ; 31:10, s. 1493-1496
- Journal article (peer-reviewed)
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- art (subject category)
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- Nylander, JO
- Magnusson, U
- Rosling, M
- Tove, PA
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- Uppsala University
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