Engineering for the ATLAS SemiConductor Tracker (SCT) end-cap

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MARC

Abdesselam, A. (author)

Engineering for the ATLAS SemiConductor Tracker (SCT) end-cap

Article/chapterEnglish2008

Publisher, publication year, extent ...

2008
printrdacarrier

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LIBRIS-ID:oai:DiVA.org:uu-260236
https://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-260236URI
https://doi.org/10.1088/1748-0221/3/05/P05002DOI

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Language:English
Summary in:English

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SwePubSwePub

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Subject category:ref swepub-contenttype
Subject category:art swepub-publicationtype

Notes

The ATLAS SemiConductor Tracker (SCT) is a silicon-strip tracking detector which forms part of the ATLAS inner detector. The SCT is designed to track charged particles produced in proton-proton collisions at the Large Hadron Collider (LHC) at CERN at an energy of 14 TeV. The tracker is made up of a central barrel and two identical end-caps. The barrel contains 2112 silicon modules, while each end-cap contains 988 modules. The overall tracking performance depends not only on the intrinsic measurement precision of the modules but also on the characteristics of the whole assembly, in particular, the stability and the total material budget. This paper describes the engineering design and construction of the SCT end-caps, which are required to support mechanically the silicon modules, supply services to them and provide a suitable environment within the inner detector. Critical engineering choices are highlighted and innovative solutions are presented - these will be of interest to other builders of large-scale tracking detectors. The SCT end-caps will be fully connected at the start of 2008. Further commissioning will continue, to be ready for proton-proton collision data in 2008.

Subject headings and genre

NATURVETENSKAP Fysik hsv//swe
NATURAL SCIENCES Physical Sciences hsv//eng
particle tracking detectors
large detector systems for particle and astroparticle physics
detector design and construction technologies and materials
overall mechanics design (support structures and materials
vibration analysis etc)

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Allport, P. P. (author)
Anderson, B. (author)
Andricek, L. (author)
Anghinolfi, F. (author)
Apsimon, R. J. (author)
Atkinson, T. (author)
Austin, A. (author)
Band, H. (author)
Barclay, P. (author)
Barr, A. (author)
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Batley, J. R. (author)
Beck, G. (author)
Becker, H. (author)
Bell, P. (author)
Bell, W. H. (author)
Belymam, A. (author)
Benes, J. (author)
Benes, P. (author)
Berbee, E. (author)
Bernabeu, J. (author)
Bethke, S. (author)
Bingefors, NilsUppsala universitet,Högenergifysik(Swepub:uu)nbi18939 (author)
Bizzell, J. P. (author)
Blaszczak, Z. J. (author)
Blocki, J. (author)
Broz, J. (author)
Bohm, J. (author)
Brenner, RichardUppsala universitet,Högenergifysik(Swepub:uu)richbren (author)
Brodbeck, T. J. (author)
de Renstrom, P. Bruckman (author)
Buis, R. (author)
Burton, G. (author)
Buskop, J. (author)
Buttar, C. M. (author)
Butterworth, J. M. (author)
Butterworth, S. (author)
Capocci, E. (author)
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Charlton, D. G. (author)
Cheplakov, A. (author)
Chilingarov, A. (author)
Chouridou, S. (author)
Chren, D. (author)
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Danielsen, K. M. (author)
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de Jong, P. (author)
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By the author/editor: Abdesselam, A.; Allport, P. P.; Anderson, B.; Andricek, L.; Anghinolfi, F.; Apsimon, R. J.; show more...; Atkinson, T.; Austin, A.; Band, H.; Barclay, P.; Barr, A.; Batchelor, L. E.; Bates, R. L.; Batley, J. R.; Beck, G.; Becker, H.; Bell, P.; Bell, W. H.; Belymam, A.; Benes, J.; Benes, P.; Berbee, E.; Bernabeu, J.; Bethke, S.; Bingefors, Nils; Bizzell, J. P.; Blaszczak, Z. J.; Blocki, J.; Broz, J.; Bohm, J.; Brenner, Richard; Brodbeck, T. J.; de Renstrom, P. ...; Buis, R.; Burton, G.; Buskop, J.; Buttar, C. M.; Butterworth, J. ...; Butterworth, S.; Capocci, E.; Carpentieri, C.; Carter, A. A.; Carter, J. R.; Chamizo, M.; Charlton, D. G.; Cheplakov, A.; Chilingarov, A.; Chouridou, S.; Chren, D.; Chu, M. L.; Cindro, V.; Ciocio, A.; Civera, J. V.; Clark, A.; Coe, P.; Colijn, A. P.; Cooke, P. A.; Costa, M. J.; Costanzo, D.; Curtis-Rous, M.; Dabinett, C.; Dabrowski, W.; Dalmau, J.; Danielsen, K. M.; D'Auria, S.; Dawson, I.; de Jong, P.; Dervan, P.; Dobson, E.; Doherty, F.; Dolezal, Z.; Donega, M.; D'Onofrio, M.; Dorholt, O.; Doubrava, M.; Duerdoth, I. P.; Duisters, C.; Duxfield, R.; Dwuznik, M.; Eckert, S.; Eklund, L.; Escobar, C.; Evans, D. L.; Fadeyev, V.; Fasching, D.; Feld, L.; Ferguson, D. P. ...; Ferrari, P.; Ferrere, D.; Fopma, J.; Ford, P.; Fortin, R.; Foster, J. M.; Fox, H.; Fraser, T. J.; Freestone, J.; French, R. S.; Fuster, J.; Gallop, B. J.; Galuska, M.; Gannaway, F.; Garcia, C.; Garcia-Navarro, ...; Gibson, M.; Gibson, S.; Gnanvo, K.; Godlewski, J.; Gonzalez, F.; Gonzalez-Sevilla ...; Goodrick, M. J.; Gorfine, G.; Gorisek, A.; Gornicki, E.; Greenall, A.; Greenfield, D.; Gregory, S.; Grillo, A. A.; Grosse-Knetter, ...; Gryska, C.; Haddad, L.; Hara, K.; Harris, M.; Hartjes, F. G.; Hauff, D.; Hawes, B.; Hayler, T.; Haywood, S. J.; Heinemann, F.; Heinzinger, K.; Hessey, N. P.; Heusch, C.; Hicheur, A.; Hill, J. C.; Hodgkinson, M.; Hodgson, P.; Hollins, T. I.; Holt, R.; Homna, J.; Horaziovsky, T.; Howell, D.; Hughes, G.; Huse, T.; Ibbotson, M.; Ikegami, Y.; Ilyashenko, I.; Issever, C.; Jakubek, J.; Jackson, J. N.; Jakobs, K.; Jared, R. C.; Jarron, P.; Johansson, P.; John, D.; Jones, A.; Jones, M.; Jones, T. J.; Joos, D.; Joseph, J.; Jovanovic, P.; Jusko, J.; Jusko, O.; Kaplon, J.; Karagoz-Unel, M.; Ketterer, Ch.; Kodys, P.; Koffeman, E.; Kohout, Z.; Kohriki, T.; Kok, H.; Kondo, T.; Koperny, S.; Korporaal, A.; Koukol, V.; Kral, V.; Kramberger, G.; Kubik, P.; Kudlaty, J.; Kuilman, W.; Kundu, N.; Lacasta, C.; Lacuesta, V.; Lau, W.; Lee, S. C.; Leguyt, R.; Leney, K.; Lenz, S.; Lester, C. G.; Liang, Z.; Liebicher, K.; Limper, M.; Lindquist, L. E.; Lindsay, S.; Linhart, V.; Lintern, A.; Locket, C.; Lockwood, M.; Loebinger, F. K.; Lozano, M.; Ludwig, I.; Ludwig, J.; Lutz, G.; Maassen, M.; Macina, D.; Macpherson, A.; MacWaters, C.; Magrath, C. A.; Malecki, P.; Mandic, I.; Mangin-Brinet, M ...; Marshall, G.; Marti-Garcia, S.; Martinez-McKinne ...; Matheson, J. P.; McEwan, F.; McMahon, S. J.; McPhail, D.; Meinhardt, J.; Mellado, B.; Mercer, I. J.; Messmer, I.; Mikulec, B.; Mikuz, M.; Mima, S.; Mistry, K.; Mitra, A.; Mitsou, V. A.; Modesto, P.; Moed, S.; Mohn, B.; Moles, R.; Moorhead, G. F.; Moreno, B.; Morin, J.; Morris, J.; Moser, H. G.; Moszczynski, A.; Muijs, A. J. M.; Munneke, B.; Murray, W. J.; Muskett, D.; Nacher, J.; Nagai, K.; Naito, D.; Nakano, I.; Nelson, C.; Nichols, A.; Nickerson, R. B.; Nisius, R.; Noviss, J.; Olcese, M.; O'Shea, V.; Oye, O. K.; Paganis, S.; Palmer, M. J.; Parker, M. A.; Parzefall, U.; Pater, J. R.; Pernegger, H.; Perrin, E.; Phillips, A.; Phillips, P. W.; Pieron, J. P.; Poltorak, K.; Pospisil, S.; Postranecky, M.; Pritchard, T.; Prokofiev, K.; Raine, C.; Ratoff, P. N.; Reitmeijer, A.; Reznicek, P.; Richter, R. H.; Robichaud-Veronn ...; Robinson, D.; Robson, A.; Rodriguez-Oliete ...; Roe, S.; Rolfe, G.; Rovenkamp, J.; Runge, K.; Saavedra, A.; Sadrozinski, H. ...; Sanchez, F. J.; Sandaker, H.; Schieck, J.; Schuijlenburg, H ...; Siegrist, J.; Seiden, A.; Sfyrla, A.; Simm, G.; Slatter, J.; Slavieek, T.; Smith, B.; Smith, K. M.; Smith, N. A.; Snippe, C.; Snow, S. W.; Solar, M.; Solberg, A. O.; Sopko, B.; Sopko, V.; Sospedra, L.; Southern, G. D.; Sowinski, M.; Spencer, E.; Spieler, H.; Stanecka, E.; Stapnes, S.; Stastny, J.; Steckl, I.; Stodulski, M.; Strachko, V.; Stradling, A.; Stugu, B.; Sutcliffe, P.; Szczygiel, R.; Takashima, R.; Tanaka, R.; Tappern, G.; Tarrant, J.; Taylor, G. N.; Temple, S.; Teng, P. K.; Terada, S.; Thompson, R. J.; Thresher, N. E.; Titov, M.; Tovey, D. R.; Tratzl, G.; Tricoli, A.; Turala, M.; Turner, P. R.; Tyndel, M.; Ullan, M.; Unno, Y.; Vickey, T.; Vacek, V.; Van der Kraaij, ...; Van Ovenbeek, M.; Viehhauser, G.; Vu, C.; Villani, E. G.; Anh, T. Vu; Vossebeld, J. H.; Wachler, M.; Wallny, R.; Ward, C. P.; Warren, M. R. M.; Wastie, R.; Weber, M.; Weidberg, A. R.; Weilhammer, P.; Wells, P. S.; Werneke, P.; Wetzel, P.; White, M. J.; Wiesmann, M.; Wilmut, I.; Wilson, J. A.; Wolter, M.; Wormald, M. P.; Wu, S. L.; Wu, X.; Zimmer, J.; Zseneii, A.; Zhu, H.; show less...

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