Neutron reflectometry of anionic surfactants on sapphire: A strong maximum in the adsorption near the critical micelle concentration

Li, Ning NingUniv Oxford, Dept Chem, Phys & Theoret Chem Lab, S Parks Rd, Oxford OX1 3QZ, England. (författare)

Neutron reflectometry of anionic surfactants on sapphire : A strong maximum in the adsorption near the critical micelle concentration

The adsorption of the anionic surfactants, lithium, sodium and cesium dodecylsulfates, and sodium decylsulfonate, on the positively charged C-plane (0001) of sapphire (alumina) has been measured using neutron reflection. For each of the four surfactants there is a strong maximum in the adsorption at about the critical micelle concentration. The maximum becomes more marked from lithium to cesium. The measurements were reproduced over a range of different physical conditions and could not be accounted for in terms of impurities. The maximum is explained quantitatively by using the combination of a mass action model to calculate the mean activity of the surfactant, and a cooperative model of the adsorption (Frumkin), in which saturation of the layer is not attained until well above the critical micelle concentration.

Thomas, Robert K.Univ Oxford, Dept Chem, Phys & Theoret Chem Lab, S Parks Rd, Oxford OX1 3QZ, England. (författare)
Rennie, Adrian R.Uppsala universitet,Materialfysik(Swepub:uu)adren227 (författare)
Univ Oxford, Dept Chem, Phys & Theoret Chem Lab, S Parks Rd, Oxford OX1 3QZ, England.Materialfysik (creator_code:org_t)

Ingår i:Journal of Colloid and Interface Science: Elsevier BV471, s. 81-880021-97971095-7103

Av författaren/redakt...: Li, Ning Ning; Thomas, Robert K ...; Rennie, Adrian R ...

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