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- Mankefors, SUppsala universitet,Fysiska institutionen (author)
Theoretical investigation of the thickness dependence of soft-x-ray emission from thin AlAs(100) layers buried in GaAs
- Article/chapterEnglish2000
Publisher, publication year, extent ...
- AMERICAN PHYSICAL SOC,2000
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- LIBRIS-ID:oai:DiVA.org:uu-37035
- https://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-37035URI
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- Language:English
- Summary in:English
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- Addresses: Mankefors S, Chalmers Univ Technol, Dept Phys, S-41296 Gothenburg, Sweden. Chalmers Univ Technol, Dept Phys, S-41296 Gothenburg, Sweden. Hogskolan Skovde, Dept Nat Sci, S-54128 Skovde, Sweden. Univ Uppsala, Dept Phys, S-75121 Uppsala, Sweden.
- Ultrathin AlAs(100) layers of 1-, 2-, and 5-ML thickness buried in GaAs are investigated by nb initio calculations. Unique experimental soft-x-ray emission spectra are explained in terms of interface effects and changes with layer thickness are found in t
Subject headings and genre
- NORM-CONSERVING PSEUDOPOTENTIALS; BAND OFFSETS; GAAS/ALAS SUPERLATTICES; ELECTRONIC-STRUCTURE; GROUND-STATE; MODEL; HETEROJUNCTIONS; SURFACES; DENSITY
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- Nilsson, PO (author)
- Kanski, J (author)
- Andersson, T (author)
- Karlsson, K (author)
- Agui, A (author)
- Sathe, C (author)
- Guo, JH (author)
- Nordgren, J (author)
- Uppsala universitetFysiska institutionen (creator_code:org_t)
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- In:PHYSICAL REVIEW B: AMERICAN PHYSICAL SOC61:8, s. 5540-55451098-0121
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