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Search: WFRF:(Chen E) > (2000-2004) > Scaling of high-k d...

  • Heyns, M (author)

Scaling of high-k dielectrics towards sub-Inm EOT

  • Article/chapterEnglish2003

Publisher, publication year, extent ...

  • 2003
  • printrdacarrier

Numbers

  • LIBRIS-ID:oai:DiVA.org:uu-46460
  • https://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-46460URI

Supplementary language notes

  • Language:English

Part of subdatabase

Classification

  • Subject category:ref swepub-contenttype
  • Subject category:kon swepub-publicationtype

Subject headings and genre

Added entries (persons, corporate bodies, meetings, titles ...)

  • Beck, S (author)
  • Bender, H (author)
  • Blomme, P (author)
  • Boullart, W (author)
  • Brijs, B (author)
  • Carter, R (author)
  • Caymax, M (author)
  • Clues, M (author)
  • Conard, T (author)
  • De Gendt, S (author)
  • Degraeve, R (author)
  • Delabie, A (author)
  • Deweerdt, W (author)
  • Groeseneken, G (author)
  • Henson, K (author)
  • Kauerauf, T (author)
  • Kubicck, S (author)
  • Lucci, L (author)
  • Lujan, G (author)
  • Mentens, J (author)
  • Pantisano, L (author)
  • Petry, J (author)
  • Richard, O (author)
  • Rohr, E (author)
  • Schram, T (author)
  • Vandervvorst, W (author)
  • van Doome, P (author)
  • van Eishocht, S (author)
  • Wetslinder, JörgenUppsala universitet,Institutionen för teknikvetenskaper,Elektronik,Fasta tillståndets elektronik (author)
  • Witters, T (author)
  • Zhao, C (author)
  • Carter, E (author)
  • Chen, J (author)
  • Cosnier, V (author)
  • Green, M (author)
  • Jang, S E (author)
  • Kaushik, V (author)
  • Kerber, A (author)
  • Kluth, J (author)
  • Lin, S (author)
  • Tsai, W (author)
  • Young, E (author)
  • Manabe, Y (author)
  • Shimamoto, Y (author)
  • Bajolet, P (author)
  • de Witte, H (author)
  • Maes, J W (author)
  • Date, L (author)
  • Pique, D (author)
  • Coenergrachts, B (author)
  • Vertommen, J (author)
  • Passefort, S (author)
  • Uppsala universitetInstitutionen för teknikvetenskaper (creator_code:org_t)

Related titles

  • In:Proceedings of International Symposium on VLSI Technology, Systems, and Applications, s. 247-250

Internet link

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