Graphite surface topography induced by Ta cluster impact and oxidative etching

• Freshly cleaved highly oriented pyrolytic graphite (HOPG), when baked in air at approximate to 630 degrees C, forms one-monolayer (ML)-deep circular pits due to oxidation initiated at surface defect sites. We found that the areal density and depths of the

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SCANNING TUNNELING MICROSCOPY; ORIENTED PYROLYTIC-GRAPHITE; MOLECULAR-DYNAMICS SIMULATIONS; SLOW GOLD CLUSTERS; BASAL-PLANE; ION-IMPACT; PROTEIN ADSORPTION; FORCE MICROSCOPY; DEFECT FORMATION; PIT GROWTH

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