Anomalous diffraction effect on the surface core-level photoemission from Si(001)2x1-Cs surface

• The angular dependence of the Si 2p photoelectron intensity has been measured for a Cs-saturated Si(001)2 x 1 surface. A surface Si 2p component, which is attributed to the Si-dimer underneath the Cs overlayer, shows a large intensity variation as a funct

Nyckelord

photoelectron diffraction; photoemission intensity; surface core-level shifts; layer attenuation model; PHOTOELECTRON DIFFRACTION; ELECTRONIC-STRUCTURES; DOUBLE-LAYER; SPECTROSCOPY; ADSORPTION; COVERAGE; DIMERS; STATES; 2X1; SI

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